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High-Efficiency HIT Solar Cells for Excellent Power Generating Properties

  • Toshihiro Kinoshita (a1), Daisuke Ide (a1), Yasufumi Tsunomura (a1), Shigeharu Taira (a1), Toshiaki Baba (a1), Yukihiro Yoshimine (a1), Mikio Taguchi (a1), Hiroshi Kanno (a1), Hitoshi Sakata (a1) and Eiji Maruyama (a1)...


In order to achieve the widespread use of HIT (Hetero-junction with I etero-Intrinsic T ntrinsic Thin-layer) solar cells, it is important to reduce the power generating cost. There are three main approaches for reducing this cost: raising the conversion efficiency of the HIT cell, using a thinner wafer to reduce the wafer cost, and raising the open circuit voltage to obtain a better temperature coefficient. With the first approach, we have achieved the highest conversion efficiency values of 22.3%, confirmed by AIST, in a HIT solar cell. This cell has an open circuit voltage of 0.725 V, a short circuit current density of 38.9 mA/cm2 and a fill factor of 0.791, with a cell size of 100.5 cm2. The second approach is to use thinner Si wafers. The shortage of Si feedstock and the strong requirement of a lower sales price make it necessary for solar cell manufacturers to reduce their production cost. The wafer cost is an especially dominant factor in the production cost. In order to provide low-priced, high-quality solar cells, we are trying to use thinner wafers. We obtained a conversion efficiency of 21.4% (measured by Sanyo) for a HIT solar cell with a thickness of 85μm. Even better, there was absolutely no sagging in our HIT solar cell because of its symmetrical structure. The third approach is to raise the open circuit voltage. We obtained a remarkably higher Voc of 0.739 V with the thinner cell mentioned above because of its low surface recombination velocity. The high Voc results in good temperature properties, which allow it to generate a large amount of electricity at high temperatures.



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9. Terakawa, A. et al. , “High Efficiency HIT Solar Cells and the Effects of Open Circuit Voltage on Temperature Coefficients”, Fifteenth PVSEC (2005).


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