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High Resolution Tem Studies of β-Alumina Type Structures

  • K. J. Morrissey (a1), Z. Elgat (a1), Y. Kouh (a1) and C. B. Carter (a1)

Abstract

High resolution transmission electron microscopy (HRTEM) has been used to study structures found in secondphase particles in commercial alumina compacts. Analytical electron microscopy has been used to identify elements present in the particles. Computer image simulation has been used for both the structural interpretation of high resolution images and predicting the effect which the presence of other elements would have on the observed structures.

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1. Morrissey, K. J. and Carter, C. B., “Analysis of Second-Phase Particles in Al2O3,” Adv. in Materials Characterization, 297–307 (1983).
2. Morrissey, K. J. and Carter, C. B., “Second-Phase Particles in Al2O3,” in preparation.
3. Blanc, M., Mocellun, A. and Strudel, J. L., “Observations of Potassium β'''-Alumina in Sintered Alumina,” J. Am. Ceram. Soc. 60 (9–10), 403409 (1977).
4. De Jonghe, L. C., “Fast Ion Conductors”, J. Am. Ceram. Soc. 62 (5–6), 289293 (1979).
5. Bovin, J., “High Resolution Electron Microscopy Images of Defects in Mgand Li-stabilized B''-aluminas,” Acta Cryst. A35, 572580 (1979).
6. Matsui, Y. and Horiuchi, S., “Irradiation-Induced Defects in ß''-Alumina Examined by IMV High-Resolution Electron Microscopy,” Acta Cryst., A37, 5161 (1981).
7. Bettman, M. and Turner, L. L., On the Structure of Na2O.4Mgo.15Al2O3, a Variant of β-Alumina, Inorg. Chem. 10:(7), 14421446 (1971).
8. Hull, R., Smith, D. and Humphreys, C. J., “A high-resolution electron microscopic study of defects in sodium β'''-alumina,” J. of Microscopy, 130, Pt. 2, 203214 (1983).

High Resolution Tem Studies of β-Alumina Type Structures

  • K. J. Morrissey (a1), Z. Elgat (a1), Y. Kouh (a1) and C. B. Carter (a1)

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