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High Resolution Tem Applied to Nanoscale Structure Studies

Published online by Cambridge University Press:  21 February 2011

L. Beltran Del Rio ,
M.Jose Yacaman ,
S. Tehuacanero  and
A. Gomez
L. Beltran Del Rio
Affiliation:
Universidad Nacional Autónoma de México, Departamento de Materia Condensada, Apartado Postal 20–364 Mdxico 01000 D.F
M.Jose Yacaman
Affiliation:
Universidad Nacional Autónoma de México, Departamento de Materia Condensada, Apartado Postal 20–364 Mdxico 01000 D.F
S. Tehuacanero
Affiliation:
Universidad Nacional Autónoma de México, Departamento de Materia Condensada, Apartado Postal 20–364 Mdxico 01000 D.F
A. Gomez
Affiliation:
Universidad Nacional Autónoma de México, Departamento de Materia Condensada, Apartado Postal 20–364 Mdxico 01000 D.F
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Abstract

In this work, digital image processing techniques are used to study the structure of small metallic particles imaged under high resolution conditions. An algorithm is devised to extract directly from the micrographs the coordinates of columns of atoms in such a way that the crystal structure of the particles and their boundaries can be determined. For distorted regions (such as grain boundaries) the actual positions can be compared to the ones in the ideal lattice so that a general trend of the distortion field can be elucidated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 177
Copyright
Copyright © Materials Research Society 1994

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References

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