Skip to main content Accessibility help

High Resolution Electron Microscopy Studies On The Microstructure Of β-Si3N4w/Al Interfaces In A β-Si3N4w/6061Al Composite

  • X. G. Ning (a1), J. Pan (a2), K. Y. Hu (a1) and H. Q. Ye (a1)


The whisker/matrix interfaces in a β-Si3N4w/60 61Al composite were structurally characterized by high resolution transmission electron microscopy (HRTEM). It was shown that there was a nearly amorphous layer (2–3 nm thickness) at a whisker/matrix interface. The magnesium segregation at the whisker/Al interface was revealed by electron dispersive analysis of x-ray (EDAX). MgO and MgAl2O4 nanocrystal particles were formed at the whisker/matrix interface due to the Mg segregation there during the manufacturing of the composite. The Mg2Si particles preferred to precipitate at the whisker/Al interface when the composite was processed with T6 heating treatment. There were specific orientation relationship of the MgAl2O4 or Mg2Si particles with the β-Si3N4 whiskers.



Hide All
[1] Matsubara, H., Nishida, Y., Yamada, M., Shirayanagi, I. and Imai, T., J. Mater. Sci. Lett. 6, 1313 (1987).
[2] lmai, T., Mabuchi, M., Tozama, Y. and Yamada, M., J. Mater. Sci. Lett. 9, 225 (1990).
[3] Mabuchi, M., Imai, T., Kubo, K., Higashi, K., Okada, Y. and Tanimura, S., Mater. Lett. 11, 339 (1991).
[4] Homeny, J., Neergaard, L.J., Harasek, K.R., Donner, J.T. and Bradley, S.A., J. Am. Ceram. Soc. 73 [1], 102 (1990).
[5] Alexander, K.B., Angelini, P. and Becher, P.F., in Mater. Res. Soc. Proc, vol.183 (Eds by Sinclair., R., Smith, D.J. and Dahmen., U., Pittsburgh, Pensyvania, 1990), pp. 273.


Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed