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High Resolution Double Crystal Diffractometry of High TcSuperconducting Epitaxial Gd-Ba-Cu-O Films

Published online by Cambridge University Press:  26 February 2011

D Y Dai ,
G S Green ,
B K Tanner ,
H C Li ,
H R Yi  and
R L Wang
D Y Dai
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, UK
G S Green
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, UK
B K Tanner
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, UK
H C Li
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100080, People's Republic of China
H R Yi
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100080, People's Republic of China
R L Wang
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100080, People's Republic of China
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Abstract

High-Tc superconducting epitaxial thin films of gadolinium barium copper oxide,grown in situ by dc-magnetron sputtering onto substrates of single crystal (001) orientated LaAIO3 , SrTiO3 and yttrium stabilisedZrO2 have been studied by high resolution double axis difffactometry, X-ray white beam-Laue topography and double crystal topography. Rocking curve halfwidths were found to vary from about 1000 to 3000 arc seconds, very good in thecontext of these complex materials. The topographs showed that the orientations of the small crystallites was randomly distributed across the sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 841
Copyright
Copyright © Materials Research Society 1991

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References

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