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Heteroepitaxial Barium Hexaferrite Films on (111) Magnesium Oxide Substrates

Published online by Cambridge University Press:  10 February 2011

Steven A. Oliver ,
Soack Dae Yoon ,
Izabella Kozulin ,
Ming Ling Chen ,
Xu Zuo  and
Carmine Vittoria
Steven A. Oliver
Affiliation:
Center for Electromagnetic Research, Northeastern University, Boston MA 02115
Soack Dae Yoon
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA 02115
Izabella Kozulin
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA 02115
Ming Ling Chen
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA 02115
Xu Zuo
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA 02115
Carmine Vittoria
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA 02115
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Abstract

High quality films of barium hexaferrite (BaFe12O19) were deposited by pulsed laser ablation onto MgO (111) substrates. In contrast to previous films deposited onto c-plane sapphire (Al203), these films were expected to have compressive biaxial stress, and indeed showed no indications for either cracking or delamination to a film thickness of 32 νm. All films were found to be highly c-axis textured by both x-ray diffraction measurements and magnetization results. The saturation magnetization (4πMs = 4.2 kG) and uniaxial anisotropy field (HA = 16 kOe) values for these films approach bulk values. Ferrimagnetic resonance measurements on a calcined 3 μm thick film show a narrow linewidth (ΔH ∼ 100 Oe) for the uniform resonance mode. The properties of these films approach those required for self-biased millimeter wavelength devices.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 623: Symposium U – Materials Science of Novel Oxide-Based Electronics , 2000 , 137
Copyright
Copyright © Materials Research Society 2000

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