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Guided Formation of Nanostructures in Thin Films

Published online by Cambridge University Press:  01 February 2011

Wei Lu  and
Dongchoul Kim
Wei Lu
Affiliation:
Mechanical Engineering, University of Michigan Ann Arbor, MI 48109–2125, U.S.A.
Dongchoul Kim
Affiliation:
Mechanical Engineering, University of Michigan Ann Arbor, MI 48109–2125, U.S.A.
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Abstract

A thin two-component epilayer grown on a solid surface may separate into distinct phases. Sometimes the phases select sizes about 10 nm, and order into an array of stripes or disks. However, the pattern types are limited and the location of the features is not controlled. This paper develops a dynamic model to simulate guided self-assembly. In particular, we look at the effect of surface chemistry on the pattern formation process. The simulations suggest that diverse patterns may be produced by tuning the surface chemistry of a substrate. In addition, the self-assembled features may be anchored at specific locations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 795: Symposium U – Thin Films - Stresses and Mechanical Properties X , 2003 , U11.10
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Kern, K., Niebus, H., Schatz, A., Zeppenfeld, P., George, J., and Comsa, G., Phys. Rev. Lett. 67, 855 (1991).Google Scholar
2. Plass, R., Last, J. A., Bartelt, N. C., and Kellogg, G. L., Nature 412, 875 (2001).Google Scholar
3. Pohl, K., Bartelt, M. C., de la Figuera, J., Bartelt, N. C., Hrbek, J., Hwang, R. Q., Nature 397, 238 (1999).Google Scholar
4. Umezawa, K., Nakanishi, S., Yoshimura, M., Ojima, K., Ueda, K., and Gibson, W. M., Phys. Rev. B 63, 35 402 (2001).Google Scholar
5. Alerhand, O. L., Vanderbilt, D., Meade, R. D., and Joannopoulos, J. D., Phys. Rev. Lett. 61, 1973 (1988).Google Scholar
6. Lu, W. and Suo, Z., Metallkd. 90, 956 (1999).Google Scholar
7. Cammarata, R. C., Prog. Surf. Sci. 46, 1 (1994).Google Scholar
8. Cammarata, R. C. and Sieradzki, K., Annu. Rev. Mater. Sci. 24, 215 (1994).Google Scholar
9. Ibach, H., Surf. Sci. Rep. 29, 193 (1997).Google Scholar
10. Ng, K. -O. and Vanderbilt, D., Phys. Rev. B 52, 2177 (1995).Google Scholar
11. Suo, Z. and Lu, W., J. Mech. Phys. Solids 48, 211 (2000).Google Scholar
12. Lu, W. and Suo, Z., Phys. Rev. B 65, 085401 (2002).Google Scholar
13. Lu, W. and Suo, Z., Z. Phys. Rev. B 65, 205418 (2002).Google Scholar
14. Lu, W. and Suo, Z., J. Mech. Phys. Solids 2001, 49, 1937.Google Scholar
15. Suo, Z. and Lu, W., J. Nanopart. Res. 2, 333 (2000).Google Scholar
16. Cahn, J. W. and Hilliard, J. E., J. Chem. Phys. 28, 258 (1958).Google Scholar