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Growth Characteristics of Co-Cr Thin Films for Magnetic Recording

  • B. G. Demczyk (a1) and D. E. Laughlin (a1)

Abstract

The growth characteristics of magnetron sputtered Co-22%Cr thin films on amorphous glass or carbon substrates have been investigated utilizing transmission electron microscopy,. X-ray diffraction, electrical resisivity and in-plane stress measurements. Results indicate that the initial deposit is “amorphous”, but that isolated islands of small crystallites form before the film reaches 5nm film thickness. By 10nm, well oriented grains with hcp c axis perpendicular to the film plane develop, and by 50nm, a twinned columnar microstructure is evident. As this occurs, the in-plane film stress becomes constant. Also, we have observed a distinct subgrain structure in the thinner films (10–50 nm), and this is reflected in the electrical resistivity. This cannot be accounted for by an “evolutionary selection” growth scenario, but must be related to the low surface mobility of adatoms at these low substrate deposition temperatures.

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1) Iwasaki, S. and Nakamura, Y., IEEE Trans. Mag. MAG–13 (5), 1272 1977.
2) Weilinga, T., PhD Dissertation, Twente Univ. of Tech., Enschede, The Netherlands 1983.
3) Hergt, R., Pfeiffer, H. and Fritzch, L., Phys. Stat. Sol. (a) 98, 69 1986.
4) Grundy, P.J., Ali, M. and Faunce, C. A., IEEE Trans Mag., MAG–25 (5), 794 1984.
5) Futamoto, M., Honda, Y., Kakibayashi, H., Shimotsu, T. and Yoshida, K., Jap. Jl. Appl. Phys. 24 (6), L460 1985.
6) Hwang, C., Laughlin, D.E., Mitchell, P.V., Layadi, A., Mountfield, K.R., Snyder, J. and Artman, J.O., J. Magn. Mag. Mat., 54–57 ,1676 1986.
7) Lee, J. W., Demczyk, B.G., Mountfield, K.R., and Laughlin, D.E., J. Appl. Phys., 61 (8), 3813 1987.
8) Lee, J.W., Demczyk, B.G., Mountfield, K.R.and Laughlin, D.E., IEEE Trans. Mag., MAG–23 (5), 2455 1987.
9) Young, D.W., Ho, H., Bauer, C.L., Mahajan, S. and Milnes, A.G., Proc. 1988 MRS Spring Mtg.
10) Edington, J.W., Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold Co., N.Y. 1976, p 83.
11) Sondheimer, E.H., Adv. Phys.,1 ,1 1952.
12) Klockholm, E. and Berry, B.S., J. Electrochem. Soc., 824 1968.
13) Hoffman, R.W., in Physics of Thin Films, Hass, G., ed., Academic Press, N.Y., 3, 211 1966.
14) Byun, L., Silverstein, J.M., and Judy, J.H., unpublished research.
15) Van der Drift, A., Philips Res. Rpts.,22, 267 1967.
16) Grovenor, C.R.M.,Hentzell, H.T.G. and Smith, D.A., Acta. Met., 32 (5), 773 1984.

Growth Characteristics of Co-Cr Thin Films for Magnetic Recording

  • B. G. Demczyk (a1) and D. E. Laughlin (a1)

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