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Growth and Characterization of a Combinatorial Array of Mixed-Phase Magnesium-Aluminum Thin-Film Alloys

Published online by Cambridge University Press:  01 February 2011

Charles Olk
Affiliation:
charles.h.olk@gm.com, General Motors R&D, Materials & Processes Lab, MC 480-106-224, 30500 Mound Rd, Warren, MI, 48090-9055, United States
Daad B. Haddad
Affiliation:
daad.haddad@gm.com, General Motors R&D, Materials and Processes Lab, MC 480-106-224, 30500 Mound Rd., Warren, MI, 48090-9055, United States
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Abstract

Combinatorial gradient-controlled sputter deposition has been employed to produce a library of 100 separate thin films with a wide range of Mg-Al alloy compositions. We have successfully isolated the â (Mg17Al12) phase in polycrystalline films for investigation. The presence of the â phase has been found to be desirable for increasing corrosion resistance; however, in structural components under tensile loading and/or at elevated temperatures, the â phase precipitates undergo coarsening which induces poor creep behavior in several common alloys. We have also synthesized amorphous Mg-Al and mixed-phase compositions as identified by X-ray diffraction measurements. Details of the growth procedure as well as structural and compositional characterization are presented.

Keywords

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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