Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T09:41:02.511Z Has data issue: false hasContentIssue false

Grain Size Relationships between the Magnetic Layer and the Underlayers in CoCrPtTa Recording Media

Published online by Cambridge University Press:  14 March 2011

Kai Ma
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
Robert Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
Gerardo Bertero
Affiliation:
Komag Inc., 1704 Automation Parkway, San Jose, California 95131
Wei Cao
Affiliation:
Komag Inc., 1704 Automation Parkway, San Jose, California 95131
Get access

Abstract

This article presents a transmission electron microscopic (TEM) investigation of the relationship between the magnetic and underlayer grain sizes in CoCrPtTa/CrMo longitudinal magnetic recording media. A great deal of effort has been expended on decreasing the underlayer grain size in order to decrease that of the magnetic layer. However, our results show that the two grain sizes may not always correlate. When the underlayer (CrMo) grains are sufficiently small, the magnetic layer (CoCrPtTa) grain size does not necessarily decrease with further underlayer grain size reduction. By carefully controlling the processing conditions, CrMo grain sizes were made to vary from 16nm down to 10nm. However, the corresponding CoCrPtTa grain sizes remained nearly the same. As the underlayer grain size decreased, the ratio of magnetic to underlayer grain size increased from 0.9 to 1.4.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCE

1. Gong, H., Yang, W., Lambeth, D. N., Rao, M., and Laughlin, D. E., IEEE Trans. Magn. 34, 1612 (1998).10.1109/20.706632Google Scholar
2. Takahashi, M., Kikuchi, A., Hara, H., and Shoji, H., IEEE Trans. Magn. 34, 1573 (1998).10.1109/20.706619Google Scholar
3. Sato, H., Nakai, J., Kikuchi, A., Mitsuya, H., Shimatsu, T., and Takahashi, M., IEEE Trans. Magn. 32, 3596 (1996).10.1109/20.538701Google Scholar
4. Kanbe, T., Takahashi, Y., Tanahashi, K., Ishikawa, A., and Hosoe, Y., IEEE Trans. Magn. 35, 2667 (1999).10.1109/20.800941Google Scholar
5. Nolan, T. P., Sinclair, R., Ranjan, R., and Yamashita, T., IEEE Trans. Magn. 29 292 (1993).10.1109/20.195585Google Scholar
6. Sinclair, R., Park, D. W., Habermeier, C., and Ma, K., Mat. Res. Soc. Symp. Proc., in press(2000).Google Scholar
7. Park, D.W., Sinclair, R., Lal, B. B., Malhotra, S. S., and Russak, M. A., J. Appl. Phys., 87, 5687 (2000).10.1063/1.372490Google Scholar
8. Allen, T., Particle Size Measurement, 5th edition (Chapman and Hall, London, 1997), p. 72.Google Scholar