Hostname: page-component-5c6d5d7d68-qks25 Total loading time: 0 Render date: 2024-08-08T01:45:46.516Z Has data issue: false hasContentIssue false
  • English
  • Français

Gas Phase and Surface Reactions in Mocvd of GaAs from Triethylgallium, Trimethylgallium, and Organometallic Arsenic Precursors

Published online by Cambridge University Press:  25 February 2011

Thomas R. Omstead ,
Penny M. Van Sickle  and
Klavs F. Jensen
Thomas R. Omstead
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Penny M. Van Sickle
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Klavs F. Jensen
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Get access

Abstract

The growth of GaAs from triethylgallium (TEG) and trimethylgallium (TMG) with tertiarybutylarsine (tBAs), triethylarsenic (TEAs), and trimethylarsenic (TMAs), has been investigated by using a reactor equipped with a recording microbalance for in situ rate measurements. Rate data show that the growth with these precursors is dominated by the formation of adduct compounds in the gas lines, by adduct related parasitic gas phase reactions in the heated zone, and by the surface reactions. A model is proposed for the competition between deposition reactions and the parasitic gas phase reactions. Model predictions are in very good agreement with experimental data for all combinations of precursors except for TEG/TMAs where extensive gallium droplet formation is observed at low temperatures. Growth of reasonable quality GaAs with Hall mobilities of 7600 cm2/Vs at 77 K using TEG and tBAs is reported for the first time.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 131: Symposium E – Chemical Perspectives of Microelectronic Materials I , 1988 , 103
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kuech, T.F., Mat. Sci. Reports 2, 1 (1987).Google Scholar
2. Chen, C.H., Larsen, C.A. and Stringfellow, G.B., Appi. Phys. Lett. 50, 218 (1987).Google Scholar
3. Lum, R.M., Klingert, J.K. and Lamont, M.G., Appl. Phys. Lett. 50, 284 (1987).Google Scholar
4. Lee, P.W., Omstead, T.R., McKenna, D.R. and Jensen, K.F., J. Crystal Growth 93, 134–142 (1988).Google Scholar
5. Lee, P.W., Omstead, T.R., McKenna, D.R. and Jensen, K.F., J. Crystal Growth 85, 165 (1987).CrossRefGoogle Scholar
6. Jordan, A.S., J. Appl. Phys. 51(4), 1980.Google Scholar
7. Omstead, T.R., Van Sickle, P.M., Lee, P.W. and Jensen, K.F., J. Crystal Growth 93, 20–28 (1988).CrossRefGoogle Scholar
8. Nishizawa, J., Kurabayashi, T. and Abe, H., Surface Science 185, 249 (1987).Google Scholar