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GaAs-on-Ge Heteroepitaxy by Atomic Hydrogen-Assisted Molecular Beam Epitaxy (H-MBE)

Published online by Cambridge University Press:  21 February 2011

James S. Harris Jr.
Affiliation:
Solid State Electronics Laboratory, Stanford University, Stanford, CA 94305
Atsushi Sutoh
Affiliation:
Institute of Materials Science, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, Japan
Mitsuo Kawabe
Affiliation:
Institute of Materials Science, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, Japan
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Abstract

The purpose of this work is to achieve a high-quality epitaxy of GaAs-on-Ge system at low growth temperatures of 300 ∼ 400°C, by atomic hydrogen-assisted molecular beam epitaxy (H-MBE), in attempt to reduce Ge segregation to a minimum and to realize a layer-by-layer two-dimensional (2D) growth mode from the initial stages of the growth. A high-quality heteroepitaxy is expected in H-MBE technique as atomic H is known to act as an effective surfactant modifying the kinetics and energetics of the growth, which are practically difficult to control on atomic-scale unless a third element like a surfactant is introduced into the growth system. It is shown with the support of reflection high-energy electron diffraction (RHEED), secondary ion mass spectroscopy (SIMS), and atomic force microscopy (AFM) characterization that an enhanced layer-by-layer 2D growth can actually be realized and (2×4) GaAs(001) surface can be achieved in low-temperature heteroepitaxy on vicinal Ge(001) substrates at 400 °C by H-MBE.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1 Venkatasubramanian, R., Timmons, M. L., Posthill, J. B., Keyes, B. M. and Ahrenkiel, R. K., Proceeding of 23rd IEEE Photovoltaic Specialists Conference, Louisville, 1993, p. 691.Google Scholar
2 Chang, N., Klem, J., Henderson, T. and Morkoç, H., J. Appl. Phys. 59, 3601 (1986).Google Scholar
3 Kawai, T., Yonezu, H., Yamaguchi, Y., Lopez, M., Pak, K. and Kürner, W., J. Cryst. Growth 127, 107 (1993).Google Scholar
4 Chang, Ching-An, J. Appl. Phys. 53, 1235 (1982).Google Scholar
5 Okada, Y., Fujita, T. and Kawabe, M., Appl. Phys. Lett. 67, 676 (1995).Google Scholar
6 Okada, Y., Fujita, T. and Kawabe, M., Jpn. J. Appl. Phys. 34, L768 (1995).Google Scholar
7 Copel, M., Reuter, M. C., Kaxiras, E. and Tromp, R. M., Phys. Rev. Lett. 63, 632 (1989).Google Scholar
8 Okada, Y., Shimomura, H. and Kawabe, M., J. Appl. Phys. 73, 7376 (1993).Google Scholar
9 Okada, Y., Ohta, S., Kawabata, A., Shimomura, H. and Kawabe, M., J. Electron. Mater. 23, 331 (1994).Google Scholar
10 Sutoh, A., Okada, Y. and Kawabe, M., to be published in Jpn. J. Appl. Phys. (1995).Google Scholar
11 Kroemer, H., J. Cryst. Growth 81, 193 (1987).Google Scholar