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Fractal Aspects of Surface Science - An Interim Report

Published online by Cambridge University Press:  28 February 2011

David Avnir
David Avnir*
Affiliation:
Department of Organic Chemistry, The Hebrew University of Jerusalem, Jerusalem 91904, Israel
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Abstract

The activity in our laboratory and in collaboration with other laboratories in applying fractal geometry for the characterization of irregular surfaces and materials and for the analysis of molecular interactions with such objects are summarized in this report. Most of the studies were performed on the xerogel of silica. Various theories and experimental techniques have been employed for this purpose. They include adsorption studies, computerized image analyses in one (boundary lines), two (textures) and three (proteins) dimensions; non-radiative, Förster-type, one step electronic energy transfer (EET); small angle X-ray scattering; and analysis of chemical reactivity of fractal objects. The relation between porosity and fractal dimension has been studied by EET, by the photophysics of adsorbed pyrene and by monolayer adsorption studies. A direct method for the determination of adsorption conformations has been developed. Limitations of the fractal approach have been identified and outlined.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 73: Symposium H – Better Ceramics Through Chemistry II , 1986 , 321
Copyright
Copyright © Materials Research Society 1986

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References

REFERENCES

1. Farin, D., Volpert, A., and Avnir, D., J. Am. Chem. Soc. 107, 3368, 5319 (1986).CrossRefGoogle Scholar
2. Rojanski, D., Huppert, D., Bale, H. B., Dacai, X., Schmidt, P. W., Farin, D., Seri-Levy, A. and Avnir, D., Proc. 2nd Int. Conf. Photoactive Solids, Scher, H., ed., Plenum Press, 1986; idem, Phys. Rev. Lett., submitted, 1986.Google Scholar
3. Avnir, D. and Pfeifer, P., Nouv. J. Chim., 7, 71 (1983).Google Scholar
4. Wellner, E., Ottolenghi, M., Avnir, D. and Huppert, D., Langmuir, submitted, 1986.Google Scholar
5. Huppert, D., Rojanski, D. and Avnir, D., manuscript in preparation.Google Scholar
6. Farin, D., Peleg, S., Yavin, D. and Avnir, D., Langmuir, 1, 399 (1985).CrossRefGoogle Scholar
7. Farin, D., Ph.d. Thesis, The Hebrew University of Jerusalem, 1986.Google Scholar
8. Avnir, D., Farin, D. and Pfeifer, P., J. Chem. Phys. 79, 3566 (1983)CrossRefGoogle Scholar
9. idem, J. coll. Interface Sci., 103, 112 (1985).CrossRefGoogle Scholar
10. idem, nature, 308, 261 (1984).CrossRefGoogle Scholar
11. Schmidt, P. W., Avnir, D. et al., unpublished.Google Scholar
12. Goldblum, A., Farin, D. and Avnir, D., manuscript in preparation.Google Scholar
13. Silverberg, M., Farin, D., Ben-Shaul, A. and Avnir, D., Ann. Israel Phys. Soc., 1986, in press (Proc. F3 Conference, Israel, January 1986, eds. Engleman, R. and Yaeger, Z..)Google Scholar
14. Peleg, S., Naor, J., Hartley, R. an Avnir, D., IEEE Trans. Pattern Anal. Machine Intel, PAMI–6, 518 (1984).CrossRefGoogle Scholar
15. Meyer, A., Farin, D. and Avnir, D., J. Am. Chem. Soc., submitted 1986.Google Scholar
16. Farin, D., Avnir, D. and Pfeifer, P., Particulate Sci. Tech. 2, 27 (1984).CrossRefGoogle Scholar
17. Pfeifer, P., Avnir, D. and Farin, D., J. Stat. Phys., 36, 699 (1984); 39, 263 (1985).CrossRefGoogle Scholar
18. Pfeifer, P. and Avnir, D., Surface Sci., 569 (1983).Google Scholar
19. Pfeifer, P. and Avnir, D., J. Chem. Phys., 79, 3558 (1983); 80, 4573 (1984).CrossRefGoogle Scholar
20. Avnir, D., Busse, R., Ottolenghi, M., Wellner, E. and Zachariasse, K., J. Phys. Chem., 89, 3521 (1985).CrossRefGoogle Scholar
21. Connolly, M. L., J. Am. Chem. Soc. 107, 1118 (1985).CrossRefGoogle Scholar
22. Klafter, J. and Blumen, A., J. Chem. Phys. 80, 875 (1984).CrossRefGoogle Scholar
23. Bale, H. D. and Schmidt, P. W., Phys. Rev. Lett., 53, 596 (1984).CrossRefGoogle Scholar
24. Levy, A., Avnir, D. and Ottolenghi, M., Chem. Phys. Lett. 121, 233 (1985).CrossRefGoogle Scholar