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Focused Ion Beam Techniques for Butterfly Wing Scales Analysis and 3-D Reconstruction

  • Katharine Dovidenko (a1), Laurie A. Le Tarte (a2) and Radislav A. Potyrailo (a3)

Abstract

We have developed and successfully demonstrated a protocol for mounting and electrical grounding of a butterfly wing scale using a series of localized electron- and ion-beam assisted Pt depositions in the dual-beam Focused Ion Beam (FIB)-SEM system. This method eliminates introduction of silver paint or other typical mounting materials, along with their chemistries, and produces a stable structure for FIB cross-sectioning, electron imaging, chemical analysis by Energy Dispersive Spectrometry (EDS) and/or Auger Electron Spectroscopy (AES), and FIB milling for 3-D reconstruction.

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1. Ghiradella, H., “Hairs, bristles, and scales,” Microscopical anatomy of invertebrates (ed. Locke, M.) (Wiley-Liss, New York, NY, 1998) pp. 257287
2. Stavenga, D.G. et al., Proc. R. Soc. Lond. B 271 p.1577 (2004)
3. Stavenga, D. G., Stowe, S., Siebke, K., J., Zeil, K. Arikawa Proc. R. Soc. Lond. B 271 p.1577 (2004)
4. Dovidenko, K., Rullan, J., Moore, R., Dunn, K.A., Geer, R.E. and Heuchling, F., Mat. Res. Soc. Symp. Proc. Vol.739, H7.7.1 (2003)

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