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Focused Ion Beam Induced Deposition

Published online by Cambridge University Press:  21 February 2011

John Melngailis  and
Patricia G. Blauner
John Melngailis
Affiliation:
Research Laboratory of Electronics, M.I.T., 77 Massachusetts Avenue, Cambridge, MA 02139
Patricia G. Blauner
Affiliation:
Research Laboratory of Electronics, M.I.T., 77 Massachusetts Avenue, Cambridge, MA 02139
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Abstract

Focused ion beam induced deposition is already in use commercially for the repair of clear defects in photomasks, where missing absorber is added. Research is being carried out to extend this technique to the repair of x-ray lithography masks and to the restructuring and repair of integrated circuits, particularly in the prototype phase. In this technique a local gas ambient is created, for example, by aiming a small nozzle at the surface. The gas molecules are thought to adsorb on the surface and to be broken up by the scanned focused ion beam. A deposit is formed with linewidth equal to the beam diameter which can be below 0.1 Ό m. At small beam diameters and low currents (50–100 pA) the time to deposit 1Όm3 is in the vicinity of 10–20 sec. If the gas is a hydrocarbon, the deposit is largely carbon, which is useful for photomask repair. On the other hand, if the gas is a metal halide or a metal organic, the deposit is metallic. The deposits have substantial concentrations of impurities due to the atoms in the organometallic, to the ion species used, or to the ambient in the vacuum chamber. Thus the resistivities of the "metal" films deposited typically range from 150 to 1000 ΌΏcm which is usable for some repairs. (Pure metals have resistivities in the range 2.5 to 12 pQcm.) We have deposited gold from dimethyl gold hexafluoro acetylacetonate and have achieved linewidths down to 0.1 Όm, patches of 1 Όm thickness with steep side walls and in some cases, resistivities approaching the bulk value. Other workers have reported deposits of Al, W, Ta, and Cr. We will review previous work in the field and present some of our own current results.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 147: Symposium C – Ion Beam Processing of Advanced Electronic Materials , 1989 , 127
Copyright
Copyright © Materials Research Society 1989

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