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Field Profile Tailoring in a-Si:H Radiation Detectors

  • I. Fujieda (a1), G. Cho (a1), J. Drewery (a1), T. Jing (a1), S. N. Kaplan (a1), V. Perez-Mendez (a1), S. Qureshi (a1), D. Wildermuth (a1) and R. A. Street (a2)...

Abstract

The capability of tailoring the field profile in reverse-biased a-Si:H diodes by doping and/or manipulating electrode shapes opens a way to many interesting device structures. Charge collection in a-Si:H radiation detectors is improved for high LET particle detection by inserting thin doped layers into the i-layer of the usual p-i-n diode. This buried p-i-n structure enables us to apply higher reverse-bias and the electric field is enhanced in the mid i-layer. Field profiles of the new structures are calculated and the improved charge collection process is discussed. Also discussed is the possibility of field profile tailoring by utilizing the fixed space charges in i-layers and/or manipulating electrode shapes of the reverse-biased p-i-n diodes.

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Perez-Mendez, V., Cho, G., Fujieda, I., Kaplan, S.N., Qureshi, S. and Street, R.A., Mater. Res. Soc. Symp. Proc. 149, 621 (1989) and see references therein.
Fujieda, I., Cho, G., Conti, M., Drewery, J., Kaplan, S.N., Perez-Mendez, V., Qureshi, S. and Street, R.A., J. Non-Cryst. Solids 115, 174 (1989).
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