Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-26T10:16:48.459Z Has data issue: false hasContentIssue false
  • English
  • Français

Fiberoptic Sensor for Minimally-Perturbing Measurement of Electric Fields in High Power Microwave Environments

Published online by Cambridge University Press:  28 February 2011

M. H. Sun ,
K. A. Wickersheim ,
A. Kamal  and
W. R. Kolbeck
M. H. Sun
Affiliation:
Luxtron Corporation, 1060 TerraBella Avenue, Mountain View, CA 94043
K. A. Wickersheim
Affiliation:
Luxtron Corporation, 1060 TerraBella Avenue, Mountain View, CA 94043
A. Kamal
Affiliation:
Luxtron Corporation, 1060 TerraBella Avenue, Mountain View, CA 94043
W. R. Kolbeck
Affiliation:
Luxtron Corporation, 1060 TerraBella Avenue, Mountain View, CA 94043
Get access

Summary

Recently a small, minimally-perturbing, isotropic, and easy-to-use fiberoptic microwave E-field probe has been developed. This probe senses microwave energy by measuring the Joule heating of a susceptor material. It consists of two Luxtron Fluoroptic sensors. One measures the temperature of the susceptor formed as a thin-walled spherical shell, the other measures the temperature of the air around the susceptor so that any ambient temperature change can be subtracted. The differential temperature (δT) obtained between the two sensors is directly related to the microwave E-field strength or the power density corresponding to that field strength at the probe.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 189: Symposium L – Microwave Processing of Materials II , 1990 , 141
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Wickersheim, K. A. et al. ,Research and Development, Nov. 1985, 114–119.Google Scholar
2. Wickersheim, K. A. et al. , EMC Technology 6 (7), 46–50 (1987).Google Scholar
3. Randa, J. et al. , Proc. IEEE National Symposium EMC, Denver, CO, May 23-25, 1989, 7–11.Google Scholar
4. Martin, V. M. et al. ,Opt. Eng. 26 (2), 170–173 (1987).Google Scholar
5. Lentz, R. R., U.S. Patent No. 4,816,654, (28 March 1989).Google Scholar
6. Gerling, J. E., J. Microwave Power E2, 1987, 199–207.Google Scholar