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Femtosecond Time Resolved Reflectivity of Optically Excited Silicon

Published online by Cambridge University Press:  15 February 2011

R. Yen ,
C. V. Shank  and
C. Hirlimann
R. Yen
Affiliation:
Bell Telephone Laboratories, Holmdel, New Jersey, USA
C. V. Shank
Affiliation:
Bell Telephone Laboratories, Holmdel, New Jersey, USA
C. Hirlimann
Affiliation:
Bell Telephone Laboratories, Holmdel, New Jersey, USA
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Abstract

We report measurements of the time resolved reflectivity of Silicon following excitation with an intense 90 femtosecond optical pulse. These measurements clearly time resolve the process of energy transfer from the optically excited electron-hole plasma to the crystal lattice and subsequent melting within the first few picoseconds.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 13 , 1982 , 13
Copyright
Copyright © Materials Research Society 1983

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References

REFERENCES

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