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Factors Influencing the Electrochromic Properties of Nickel Oxide Thin Films Derived from Sol-Gel Method by Dip Coating

Published online by Cambridge University Press:  16 February 2011

Pramod K. Sharma ,
M.C.A. Mracia ,
H. Fischer ,
A. F. Craievich  and
A. Gorenstein
Pramod K. Sharma
Affiliation:
Chemistry Department and Materials Research Center, SUNY at Binghamton, Binghamton, NY 13902-6016, USA
M.C.A. Mracia
Affiliation:
Instituto de fisica, USP, CP-66318, 05315-970, Sao Paulo, Brasil
H. Fischer
Affiliation:
Instituto de fisica, USP, CP-66318, 05315-970, Sao Paulo, Brasil
A. F. Craievich
Affiliation:
Instituto de fisica, USP, CP-66318, 05315-970, Sao Paulo, Brasil
A. Gorenstein
Affiliation:
DFA, Instituto de Fisica, UNICAMP, CP-6165, 13081, SP, Brasil
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Abstract

The synthesis of thin film of nickel oxide is important due to their potential application in eletrochromic displays which can be used in optical displays and as windows controlling the light intensity. Dip coating through sol-gel method is a possible low energy method of coating. Hence this method of film growth has been chosen under various concentration of water, catalyst (acetic acid) and precursor. The films were characterized by XRD, FTIR, thickness profiler and SEM. The films which were synthesized with the concentration of Ni=0.005 molar were found to have low positive current density while the coloration was getting dark when concentration of Ni was increased to 0.015 molar. Increase in concentration of acetic acid decreases the positive current density. Small-Angle X-ray Scattering (SAXS) and density measurements were carried out for the structural characterization of the xerogels. A denser material was obtained at high concentration of acetic acid. The physical and chemical properties of the films and xerogels are well correlated with the electrochemical properties of the films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 547: Symposium DD – Solid-State Chemistry of Inorganic Materials II , 1998 , 351
Copyright
Copyright © Materials Research Society 1999

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