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Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB
Published online by Cambridge University Press: 27 February 2012
Abstract
The mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 1421: Symposium PP – Three-Dimensional Tomography of Materials , 2012 , mrsf11-1421-pp07-09
- Copyright
- Copyright © Materials Research Society 2012
References
REFERENCES
3.
Wang, W., Ciselli, P., Kuznetsov, E., Peijs, T., Barber, A. H.
Phil. Trans. R. Soc. A
366, 1613 (2008).Google Scholar
6.
D’Amato, M.J., Marcus, M.S., Eriksson, M.A. and Carpick, R.W., Appl. Phys. Lett.
85, 4738 (2007).Google Scholar
7.
Orloff, J., Utlaut, M.W. and Swanson, L., “High Resolution Focused Ion Beams: FIB and its Applications”, New York; London: Kluwer Academic/Plenum. (2003)Google Scholar
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