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Exafs Study of Co/Cu Multilayers: Mbe Versus Sputtered

  • C. L. Foiles (a1), M. R. Franklin (a1), R. Loloee (a1), Roy Clarke (a2) and T. I. Morrison (a3)...

Abstract

EXAFS data are used to probe the local structure of Co/Cu multilayers having comparable dimensions but prepared by two different techniques, MBE and sputtering. Significant differences are found. The nearest neighbor distance in all Co layers increases about the same amount relative to the bulk value and MBE Co layers are less disordered than sputtered Co layers. Nearest neighbor distances in thinner Cu layers are less than bulk values but approach bulk value for thicker Cu layers. Nearest neighbor distances in thin MBE Cu layers are more contracted and have a more rapid thickness dependence than in sputtered Cu layers.

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Exafs Study of Co/Cu Multilayers: Mbe Versus Sputtered

  • C. L. Foiles (a1), M. R. Franklin (a1), R. Loloee (a1), Roy Clarke (a2) and T. I. Morrison (a3)...

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