Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-06-25T09:41:48.135Z Has data issue: false hasContentIssue false

Epitaxial Thin Film Structures of Electroluminescent Materials

Published online by Cambridge University Press:  21 March 2011

Norbert Koch
Affiliation:
Inst.f.Festkörperphysik, TU-Graz, A-8010 Graz, Austria
Yoshinobu Hosoi
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Nagoya 464-8602, Japan
Hisao Ishii
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Nagoya 464-8602, Japan
Antje Vollmer
Affiliation:
Institut f. Physikalische Chemie, Freie Universität Berlin, D-14195 Berlin, Germany
Günther Leising
Affiliation:
Inst.f.Festkörperphysik, TU-Graz, A-8010 Graz, Austria
Kazuhiko Seki
Affiliation:
Research Center for Materials Science, Nagoya University, Nagoya 464-8602, Japan
Get access

Abstract

Despite the fast-paced new developments and improvements of applications incorporating conjugated organic materials, rather little effort is made to obtain well-defined structures and thin films of these in order to exploit the highly anisotropic properties (e.g. conductivity, polarized light emission) of most conjugated organic materials. It has been shown that oligomers, which can easily be evaporated under ultrahigh vacuum conditions, exhibit heteroepitaxial growth on various substrates. Depending on the nature of the interaction of the organic molecules with the substrate different orientations can be obtained, as well as by simply changing the conditions of evaporation. Therefore, by going from amorphous or polycrystalline structures to highly textured or single crystalline ones new insights into the physical properties of the materials can be expected, and also new applications. We studied the formation of well-defined films of the electroluminescent oligomer p -sexiphenyl on various metal and semiconductor surfaces and determined the orientation of the molecules by means of low energy electron diffraction (LEED), infrared reflection absorption spectroscopy (IRRAS) and atomic force microscopy (AFM). Depending on the substrate material we found that the molecules are oriented either parallel or perpendicular to the substrate surface. In addition to that, highly oriented 6P films were doped with potassium, and the change in the molecular vibrational signature was investigated with IR-RAS.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Era, M., Tsutsui, T., Saito, S., Appl. Phys. Lett., 67, 2436 (1995)Google Scholar
[2] Tasch, S., Brandstätter, C., Meghdadi, F., Leising, G., Froyer, G., Athouel, L., Adv. Mater., 9, 33 (1997)Google Scholar
[3] Mikami, T., Yanagi, H., Appl. Phys. Lett., 73, 563 (1998)Google Scholar
[4] Koch, N., Pogantsch, A., List, E.J.W., Leising, G., Blyth, R.I.R., Ramsey, M.G., Netzer, F.P., Appl. Phys. Lett., 74, 2909 (1999)Google Scholar
[5] Ambrosch-Draxl, C., Majewski, J.A., Vogl, P., Leising, G., Phys. Rev. B, 51, 9668 (1995)Google Scholar
[6] Niko, A., Meghdadi, F., Ambrosch-Draxl, C., Vogl, P., Leising, G., Synth. Met., 76, 177 (1996)Google Scholar
[7] Resel, R., Koch, N., Meghdadi, F., Leising, G., Unzog, W., Reichmann, K., Thin Solid Films, 305, 232 (1997)Google Scholar
[8] Müller, B., Kuhlmann, T., Lischka, K., Schwer, H., Resel, R., Leising, G., Surf. Sci., 418, 256 (1998)Google Scholar
[9] Rakovic, D., Bozovic, I., Stepanyan, S.A., Gribov, L.A., Solid State Commun., 43, 127 (1982)Google Scholar
[10] Krichene, S., Lefrant, S, Froyer, G., Maurice, F., Pelous, Y., J. de Physique, C3–6, 733 (1983)Google Scholar
[11] Bozovic, I., Rakovic, D., Phys. Rev. B, 32, 4235 (1985)Google Scholar
[12] Buisson, J.P., Krichene, S., Lefrant, S., Synth. Met., 21, 229 (1987)Google Scholar
[13] Krichene, S., Lefrant, S., Pelous, Y., Froyer, G., Petit, M., Digua, A., Fauvarque, J.F., Synth. Met., 17, 607 (1987)Google Scholar
[14] Seidel, C., Soukopp, A., Li, R., Bäuerle, P., Umbach, E., Surf. Sci., 374, 17 (1997)Google Scholar
[15] Gebauer, W., Bässler, M., Fink, R., Sokolowski, M., Umbach, E., Chem. Phys. Lett., 266, 177 (1997)Google Scholar
[16] Glöckler, K., Seidel, C., Soukopp, A., Sokolowski, M., Umbach, E., Böhringer, M., Berndt, R., Schneider, W.-D., Surf. Sci., 405, 1 (1998)Google Scholar
[17] Soukopp, A., Glöckler, K., Kraft, P., Schmitt, S., Sokolowski, M., Umbach, E., Mena-Osteritz, E., Bäuerle, P., Hädicke, E., Phys. Rev. B, 58, 13882 (1998)Google Scholar
[18] Okudaira, K.K., Hasegawa, S., Ishii, H., Seki, K., Harada, Y., Ueno, N., J. Appl. Phys., 85, 6453 (1999)Google Scholar
[19] Zojer, E., Koch, N., Puschnig, P., Meghdadi, F., Niko, A., Resel, R., AmbroschDraxl, C., Knupfer, M., Fink, J., Bredas, J.L., Leising, G., Phys. Rev. B, in printGoogle Scholar
[20] Narioka, S., Ishii, H., Edamatsu, K., Kamiya, K., Hasegawa, S., Ohta, T., Ueno, N., Seki, K., Phys. Rev. B, 52, 2362 (1995)Google Scholar
[21] Golden, W. E., Fourier Transform Infrared Spectroscopy, 4, ed. Ferraro, J.R. and Basile, L.J. (Academic, 1985) p. 315 Google Scholar
[22] Oji, H., Ito, E., Furuta, M., Kajikawa, K., Ishii, H., Ouchi, Y., Seki, K., J. Electr. Spectr. Relat. Phenom., 101, 517 (1999)Google Scholar