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Epitaxial Growth and Structural Characterization of Single Crystalline ZnGeN2

Published online by Cambridge University Press:  15 February 2011

L.D. Zhu
Affiliation:
NZ Applied Technologies, 8A Gill Street, Woburn, MA 01801, zhu@nzat2.tiac.net
P.H. Maruska
Affiliation:
NZ Applied Technologies, 8A Gill Street, Woburn, MA 01801, zhu@nzat2.tiac.net
P.E. Norris
Affiliation:
NZ Applied Technologies, 8A Gill Street, Woburn, MA 01801, zhu@nzat2.tiac.net
P.W. Yip
Affiliation:
Air Force Research Laboratory, 80 Scott Dr., Hanscom AFB, MA 01731
L.O. Bouthillette
Affiliation:
Air Force Research Laboratory, 80 Scott Dr., Hanscom AFB, MA 01731
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Abstract

A new nitride semiconductor, single crystalline ZnGeN2 has been successfully grown by MOCVD for the first time. The epitaxial ZnGeN2 is found to be of hexagonal wurtzite lattice without ordering of the zinc and germanium atoms in the pseudomorphic Group III sublattice. Lattice constants of the ZnGeN2 are a = 3.186 ± 0.007 A, c = 5.174 ± 0.012 A, which gives c/a = 1.624.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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