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Enhancing of Small Isolated Domains and Superstructures in High Resolution Images of Oxides

Published online by Cambridge University Press:  21 February 2011

J.G. Perez-Ramirez ,
D. Michel  and
R. Portier
J.G. Perez-Ramirez
Affiliation:
Instituto de Fisica, UNAM, a.p. 20–364, 01000 México D.F., Mexico.
D. Michel
Affiliation:
Instituto de Fisica, UNAM, a.p. 20–364, 01000 México D.F., Mexico.
R. Portier
Affiliation:
CECM-CNRS, 15 Rue Georges Urbain, 94400 Vitry-Sur-Seine, France.
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Abstract

Starting from electron microscope high resolution images we apply the technique of digital image processing to analyze some structural properties of oxides. We identify the structural features in the images that give origin to the diffuse scattering observed in the electron diffraction patterns of these oxides. We obtain results for three different systems: YBaCuO and BiSrCaCuO high temperature superconductors and mullite (type germanate). The analysis and enhancement of the images is done by filtering them in their Fourier space.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 321
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Bednorz, J. G. and Mueller, K. A., Z. Phys. B 64, 189(1986).CrossRefGoogle Scholar
2. Onoda, M., Kondoh, S., Fukuda, K. and sato, M., J. J. Appl. Phys. 27, L1234(1988).CrossRefGoogle Scholar
3. Tendeloo, Van, Zandbergen, H. W. and Amelinckx, S., sol. st. comm. 63, 981(1988).Google Scholar
4. Cava, R. J., Batlogg, B., Cohen, C. H., Rietman, E. A., Zahurak, S. M. and Werder, D., Nature 329, 423(1987).Google Scholar
5. Jong, A. F., Coene, W. and Dyck, D. Van, submitted to Ultramicroscopy.Google Scholar
6. Pérez-Ramirez, J.G., Gémez, A., Castaño, V. and José-Yacamán, M., Ultramicroscopy 25, 41(1988).Google Scholar
7. Pérez-Ramirez, J. G., Pérez, R., Gómez, A., Cota-Araiza, L., Martinez, L., Herrera, R. and Josè-Yacaman, M., J. Mater. Res. 2, 153 (1987).Google Scholar
8. Pèrez, R., Pérez-Ramirez, J. G., Avalos, M., Reyes, J., Martinez, L., Orozco, E., Carrillo, E., Mendoza, A., Albarran, J., Fuentes-Maya, J., Boldú, J. L. and Josŕ-Yacamán, M., Mat. Res. Soc. Symp. Proc. 99, 601(1988).Google Scholar
9. Luo, J. S., Pérez-Ramirez, J. G., Chevalier, J-P., Michel, D. and Portier, R., J. Microsc. Spectrosc. 13, 57a(1988); Pérez-Ramirez, J. G., Mazerolles, L., Michel, D., Portier, R. and Chevalier, J-P., 56a (1988).Google Scholar
10. Pérez-Ramirez, J. G., unpublished.Google Scholar
11. Sheng, Z. Z. and Hermann, A. M., Nature 332, 55(1988); 322, 138(1988).CrossRefGoogle Scholar
12. Horiuchi, S., Maeda, H., Tanaka, Y. and Matsui, Y., J. J. Appl. Phys. 27, L1172(1988).Google Scholar
13. Ichihashi, T., Iijima, S., Kubo, Y. and Tabuchi, J., J. J. Appl. Phys. 27, L1187 (1988).CrossRefGoogle Scholar