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Enhanced Measurements of Displacements and Strains in Quasiperiodic Nanostructures

Published online by Cambridge University Press:  09 August 2013

Maciej Wielgus ,
Daniel Koguciuk ,
Zofia Sunderland ,
Krzysztof Patorski  and
Anna Piotrowska
Maciej Wielgus
Affiliation:
Institute of Micromechanics and Photonics, Warsaw University of Technology, ul. Św. A. Boboli 8, 02-525 Warszawa, Poland Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland
Daniel Koguciuk
Affiliation:
Faculty of Mechatronics, Warsaw University of Technology, ul. Św. A. Boboli 8, 02-525 Warszawa, Poland
Zofia Sunderland
Affiliation:
Institute of Micromechanics and Photonics, Warsaw University of Technology, ul. Św. A. Boboli 8, 02-525 Warszawa, Poland
Krzysztof Patorski
Affiliation:
Institute of Micromechanics and Photonics, Warsaw University of Technology, ul. Św. A. Boboli 8, 02-525 Warszawa, Poland
Anna Piotrowska
Affiliation:
Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland
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Abstract

Displacements and strains can be calculated from the microscopic image of a quasiperiodic structure by the analysis of its spectral content, consisting of a discrete set of peaks (Bragg spots in the case of the crystal structure). Typically one would choose certain peak and evaluate the displacements by investigating its neighborhood. However, there is a large amount of redundancy in such an image, as similar measurement can be performed by choosing a different Bragg spot. We demonstrate an approach which in a systematic manner employs information from multiple Bragg spots for the displacement evaluation. This has a positive influence on the quality and robustness of the measurements.

Keywords

stress/strain relationshiptransmission electron microscopy (TEM)scanning probe microscopy (SPM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1554: Symposium U – Measurements of Atomic Arrangements and Local Vibrations in Nanostructured Materials , 2013 , mrss13-1554-u04-07
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Hÿtch, M.J., Snoeck, E., Kilaas, R., “Quantitative measurement of displacement and strain fields from HREM micrographs”, Ultramicroscopy 74 (3), 131–146 (1998).CrossRefGoogle Scholar
Patorski, K., Wielgus, M., Ekielski, M., Kaźmierczak, P., “AFM nanomoiré technique with phase multiplication”, Meas. Sci. Technol. 24 035402 (2013).CrossRefGoogle Scholar
Bryngdahl, O., “Moire and higher grating harmonics”, J. Opt. Soc. Am. 65, 685–94 (1975).CrossRefGoogle Scholar
Li, Y., Xie, H., Chen, P. and Zhang, Q., “Theoretical analysis of moire fringe multiplication under a scanning electron microscope”, Meas. Sci. Technol. 22 025301 (2011).CrossRefGoogle Scholar
Galindo, P. L., Kret, S., Sanchez, A.M., Laval, J.Y., Yáñez, A., Pizarro, J., Guerrero, E., Ben, T., Molina, S.I., “The Peak Pairs algorithm for strain mapping from HRTEM images”, Ultramicroscopy 107 (12), 1186-93 (2007).CrossRefGoogle ScholarPubMed
Takeda, M., Ina, H., and Kobayashi, S., “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry”, J. Opt. Soc. Am. 72, 156–1601 (982).CrossRefGoogle Scholar
Bioucas-Dias, J.M., Valadao, G., “Phase Unwrapping via Graph Cuts”, IEEE Transactions on Image Processing 16 (3), 698-709 (2007).CrossRefGoogle ScholarPubMed
Duchon, J., “Splines minimizing rotation invariant semi-norms in Sobolev spaces”, Lecture Notes in Math. 571, 85–100 Springer, Berlin (1977).CrossRefGoogle Scholar
http://www.nanomaterials.mchtr.pw.edu.pl, accesed on 19th March 2013.Google Scholar