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Enhanced Luminescence Properties of Pulsed Laser-Deposited Eu:Y2O3 Thin Film Phosphors Using Diamond Buffer Layer

Published online by Cambridge University Press:  10 February 2011

K.G. Cho ,
D. Kumar ,
D.G. Lee ,
P.H. Holloway  and
R.K. Singh
K.G. Cho
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611Email: rsing@mse.ufl.edu
D. Kumar
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611Email: rsing@mse.ufl.edu
D.G. Lee
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611Email: rsing@mse.ufl.edu
P.H. Holloway
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611Email: rsing@mse.ufl.edu
R.K. Singh
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611Email: rsing@mse.ufl.edu
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Abstract

Europium-activated yttrium oxide (Eu:Y2O3) phosphor films have been grown in-situ on (100) bare silicon and diamond-coated silicon substrates using a pulsed laser deposition technique. Diamond-coated silicon substrates were prepared by hot filament chemical vapor deposition on (100) silicon wafer. Measurements of photoluminescence and cathodoluminescence properties of Eu:Y2O3 films showed that the films grown on diamond-coated silicon substrates are brighter than the films grown on bare silicon substrates. The improved brightness of the Eu:Y2O3 films on diamond-coated silicon substrates is attributed to reduced internal reflection and enhanced scattering of incident beam with lattice. These effects are primarily brought about by the presence of a rough diamond buffer layer between the phosphor film and substrate. Oxygen environment during deposition is necessary for better crystallinity but excess oxygenation of the Eu:Y2O3 films during cooling degrades the brightness of the films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 508: Symposium B – Flat Panel Display Materials - 1998 , January 1998 , 301
Copyright
Copyright © Materials Research Society 1998

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References

1. Blasse, G., and Grabmaier, B.C., Luminescent Materials (Springer, Berlin, 1994).Google Scholar
2. Jones, S.L., Kumar, D., Singh, R.K., and Holloway, P.H., Appl. Phys. Lett. 71 (3), 404 (1997).Google Scholar
3. Marshall, D.J., Cathodoluminescence of Geological Materials (Unwin Hyman, Boston, 1988), p.10.Google Scholar
4. Pappalardo, R.G., and Hunt, R.B. Jr., J. Electrochem. Soc. 132 (3), 721 (1985).Google Scholar
5. Ozawa, L., Cathodoluminescence:theorv and applications, VCH, New York (1990).Google Scholar
6. Hirata, G.A., Mckittrick, J., Avalos-Borja, M., Siqueiros, J.M., and Devlin, D., Applied Surface Science 113/114, 509 (1997).Google Scholar
7. Cho, K.G., Kumar, D., Lee, D.G., Jones, S.L., Holloway, P.H., and Singh, R.K., Appl. Phys. Lett. 71 (23), 3335 (1997).Google Scholar
8. Wild, C., Koidl, P., Muller-Sebert, W., Walcher, H., Kohl, R., Herres, N., Rocher, R., Samlenski, R., and Brenn, R., Diamond and Related Materials 2, 158 (1993).Google Scholar
9. Wild, C., Herres, N., and Koidl, P., J. Appl. Phys. 68 (3), 973 (1990).Google Scholar
10. Forest, H., and Ban, G., J. Electrochem. Soc. 116 (4), 474 (1969).Google Scholar
11. Riedel, E. P., J. of Luminescence 1–2, 176 (1970).Google Scholar
12. Duclos, S.J., Greskovich, C.D., and O'Clair, C.R., Scintillators and Phosphor Materials. edited by Weber, M.J., Lecoq, P., Ruchti, R.C., Woody, C., Yen, W.M., and Zhu, R.-y., MRS Symp. Proc. 348, 503 (1994).Google Scholar
13. Ropp, R. C., J. Opt. Soc. Amer. 57, 213 (1967).Google Scholar
14. Maestro, P., Huguenin, D., Seigneurin, A., Deneuve, F., Lam, P.L., and Berar, J.F., J. Electrochem. Soc. 139 (5), 1479 (1992).Google Scholar
15. Rao, R.P., J. Electrochem. Soc. 143 (1), 189 (1996).Google Scholar
16. Rao, R.P., Solid State Communications 99 (6), 439 (1996).Google Scholar
17. Schaik, W.V., and Blasse, G., Chem. Mater. 4 (2), 410 (1992).Google Scholar