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Electron Microscopy Observations on the Influence of Boron Additions on Stoichiometric NiAl

Published online by Cambridge University Press:  01 January 1992

T.-C. Wu  and
S. L. Sass
T.-C. Wu
Affiliation:
Cornell University, Department of Materials Science and Engineering, Ithaca, NY 14853
S. L. Sass
Affiliation:
Cornell University, Department of Materials Science and Engineering, Ithaca, NY 14853
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Abstract

The microstructure and local chemistry in single crystal and polycrystalline stoichiometric NiAl, with and without boron additions, were investigated using transmission and analytical electron microscopy. Plate-like precipitates were present in the boron-doped NiAl. Since these precipitates were not observed in the boron-free material, they must be due to the formation of borides. After irradiation with 400kV electrons, fine scale changes in the image contrast and the appearance of diffuse scattering in the diffraction pattern indicate that a phase transformation has been induced by the electron beam.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 288: Symposium L – High-Temperature Ordered Intermetallic Alloys V , 1992 , 217
Copyright
Copyright © Materials Research Society 1995

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References

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