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Electrical Resistivity as a Characterization Tool for Nanocrystalline Metals

Published online by Cambridge University Press:  21 February 2011

J.L. McCrea
Affiliation:
Department of Metallurgy and Materials Science, University of Toronto, Toronto, ON, CanadaM5S 3E4
K.T. Aust
Affiliation:
Department of Metallurgy and Materials Science, University of Toronto, Toronto, ON, CanadaM5S 3E4
G. Palumbo
Affiliation:
Integran Technologies Inc, I Meridian Rd., Toronto, N, CanadaM9W 4Z6
U. Erb
Affiliation:
Department of Metallurgy and Materials Science, University of Toronto, Toronto, ON, CanadaM5S 3E4
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Abstract

The electrical resistivity as a function of temperature (4K to 673K) of several electrodeposited nanocrystalline materials (Ni, Ni-Fe, Co) has been examined. The contribution of the grain boundaries to the electrical resistivity was quantified in terms of a specific grain boundary resistivity, which was found to be similar to previously reported values of specific grain boundary resistivity for copper and aluminum obtained from studies involving polycrystalline materials. In the high temperature range, the resistivity of the nanocrystalline samples was monitored as a function of time. The observed time dependence of the resistivity at elevated temperatures was correlated to microstructural changes in the material. The study has shown that electrical resistivity is an excellent characterization tool for nanocrystalline materials giving useful information regarding grain size and degree of thermal stability, as well as some insight into the grain growth kinetics at various temperatures.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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