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Electrical Characterization of the Structure and Other Phenomena in Superionic PbSnF4

Published online by Cambridge University Press:  10 February 2011

Galina Milova ,
Georges Denes ,
M. Cecilia Madamba  and
M. Perfiliev
Galina Milova
Affiliation:
Concordia University, Laboratory of Solid State Chemistry and Mössbauer Spectroscopy, Laboratories for Inorganic Materials, Department of Chemistry and Biochemistry, 1455 De Maisonneuve Blvd. W., Montreal, Quebec, H3G 1 M8, Canada;
Georges Denes
Affiliation:
Concordia University, Laboratory of Solid State Chemistry and Mössbauer Spectroscopy, Laboratories for Inorganic Materials, Department of Chemistry and Biochemistry, 1455 De Maisonneuve Blvd. W., Montreal, Quebec, H3G 1 M8, Canada;
M. Cecilia Madamba
Affiliation:
Concordia University, Laboratory of Solid State Chemistry and Mössbauer Spectroscopy, Laboratories for Inorganic Materials, Department of Chemistry and Biochemistry, 1455 De Maisonneuve Blvd. W., Montreal, Quebec, H3G 1 M8, Canada;
M. Perfiliev
Affiliation:
Institute of High Temperature Electrochemistry of the Russian Academy of Sciences, Ural Division, Ekaterinburg, Russia.
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Abstract

The structure of PbSnF4 is derived from that of fluorite-type β-PbF2 The replacement of half the lead by tin results in a thousand-fold increase of the fluoride ion mobility, even though tin-fluorine bonds are strongly covalent. This is due to an increase of fluoride ion disorder on some sites. The structure of α-PbSnF4 can be interpreted as resulting from the insertion of two layers of [SnF]+ cations between each pair of layers of PbF8 cubes. This has profound bearings on the texture and properties of this material, since the tin(II) stereoactive lone pairs create very effective cleavage planes. In addition, the fluorine covalently bonded to tin occupy all vacant sites used to create Frenkel defects. However, superionicity is observed by complex impedance measurements. Transport number measurements show that fluoride ions are the charge carriers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 411: Symposium T – Electricaly-Based Microstructural Characterization , 1995 , 151
Copyright
Copyright © Materials Research Society 1996

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References

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