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Effects of Various Types of Doping on the Electronic Structure of Organic Interfaces

Published online by Cambridge University Press:  01 February 2011

Kazuhiko Seki ,
Toshio Nishi ,
Senku Tanaka ,
Tadanobu Ikame ,
Hisao Ishii  and
Kaname Kanai
Kazuhiko Seki
Affiliation:
Research Center for Materials Science, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan Research Institute for Advanced Research, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan
Toshio Nishi
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan
Senku Tanaka
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan
Tadanobu Ikame
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan
Hisao Ishii
Affiliation:
Research Institute for Electro Communication, Katahira, Aoba-ku, Sendai 980-8577, Japan
Kaname Kanai
Affiliation:
Department of Chemistry, Graduate School of Science, Nagoya University, Furocho, Chikusa-ku, Nagoya 464-8602, Japan
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Abstract

In various organic electronic devices, interfaces formed by organic layers can play important roles. We have been studying various organic interfaces for clarifying their structure and electronic structure. In this talk, we will report our recent study of the effect of various types of doping for a variety of dopants – residual impurity, atmospheric gases, and metallic and organic intentional dopants. In particular, detailed and quantitative information about the effect of oxygen from the viewpoint of electronic structure was obtained for titanyl phthalocyanine (TiOPc), and the results corresponded well with the recent report of atmospheric effect on orga nic field effect transistor.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 871: Symposium I – Organic Thin-Film Electronics , 2005 , I8.11
Copyright
Copyright © Materials Research Society 2005

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References

[1] Ishii, H., Sugiyama, K., Ito, E., and Seki, K., “Energy Level Alignment and Interfacial Electronic Structures at Organic/metal and Organic/organic Interfaces”, Adv. Mat., 11, 605–625 Google Scholar
[2] “Conjugated Polymer & Molecular Interfaces: Science & Technology for Photonic & Optoelectronic Applications”, (Eds. Salaneck, W., Seki, K., Kahn, A., and Pireaux, J.-J., Marcel Dekker Inc., N. Y.) (2002).Google Scholar
[3] Vazquez, H., Flores, F., Oszwaldowski, R., Ortega, J., Perez, R. and Kahn, A., Appl. Surf. Sci. 234, 107 (2004)Google Scholar
[4] Morikawa, Y., Ishii, H., and Seki, K., Phys. Rev. B69, 41403 (2004).Google Scholar
[5] Hayashi, N., Synth. Metals, 121, 1717 (2001).Google Scholar
[6] Oji, H., Ito, E., Furuta, M., Kajikawa, K., Ishii, H., Ouchi, Y., and Seki, K., J. Electron Spectrosc. Rel. Phenom., 101-103, 517–518 (1999) and unpublished results.Google Scholar
[7] Ishii, H., Hayashi, N., Ito, E., Washizu, Y., Sugi, K., Kimura, Y., Niwano, M., Ouchi, Y., and Seki, K., Phys. Stat. Sol. (a) 201, 1075 (2004).Google Scholar
[8] Hayashi, N., Ishii, H., Ouchi, Y., and Seki, K., J. Appl. Phys., 92, 3784 (2002).Google Scholar
[9] Pfeiffer, M., Leo, K., Zhou, X., Huang, J. S., Hofmann, M., Werner, A., and Blochwitz-Nimoth, J., Org. Electronics, 4, 89 (2003) and references therin.Google Scholar
[10] Kahn, A. and Gao, W., J. Phys., C15, S2757 (2003) and references therin.Google Scholar
[11] Tanaka, S., Kanai, K., Kawabe, E., Iwahashi, T., Nishi, T., Ouchi, Y., and Seki, K., Jpn. J. Appl. Phy.s., in press.Google Scholar
[12] Nishi, T., Kanai, K., Ouchi, Y., Willis, M. R., and Seki, K., Chem. Phys. Lett., submitted.Google Scholar
[13] Hosoi, Y., Sakurai, Y., Yamamoto, M., Ishii, H., Ouchi, Y., and Seki, K., Surf. Sci., 515, 157 (2002)Google Scholar
[14] Tada, H. Touda, H., Takada, M., and Matsushige, K.., J. Appl. Phys., 76, 873 (2000).Google Scholar
[15] Kanai, K. et al., unpublished.Google Scholar