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Effect of YBCO film characteristics on RF properties of MSL resonators with these films

Published online by Cambridge University Press:  18 March 2011

Kazunori Yamanaka ,
Akihiko Akasegawa  and
Teru Nakanishi
Kazunori Yamanaka
Affiliation:
Inorganic Materials and Polymers Laboratory, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, JAPAN
Akihiko Akasegawa
Affiliation:
Inorganic Materials and Polymers Laboratory, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, JAPAN
Teru Nakanishi
Affiliation:
Inorganic Materials and Polymers Laboratory, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, JAPAN
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Abstract

The effect of YBCO film characteristics on the RF properties of microstrip-line (MSL) resonators using two surface resistance Rs value types of films was investigated in terms of weak links. The films were characterized in both cystallinity and microstructure. The RF properties of the resonators were measured at frequencies of about 2 GHz. It was understood that the film samples with higher Rs at 70 K, which exhibited strong c-axis orientation, both the 90 and 45- degree angle grains in plane of the films, Y211 segregation, and porous structures show large influence on RF magnetic field dependence of normalized resonant frequency-shift Δfc/fc, compared with the lower Rs type. On the other hand, the films with lower Rs at 70 K had much stronger c-axis orientation, the 90-degree angle grains, and dense structures. Consequently, it was considered that the lower Rs type films possessed fewer weak-links compared with the higher Rs type films, suggesting that the misorientation in the higher Rs films result in weak-links.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 659: Symposium II – High-Temperature Superconductors-Crystal Chemistry, Processing & Properties , 2000 , II6.2
Copyright
Copyright © Materials Research Society 2001

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References

REFFERENCES

1. Kobayashi, Y., 26th European Microwave Conf. Proc., 823(1996).Google Scholar
2. Face, D.W., Pellicone, F.M., Small, R.J., Bao, L., Warrington, M.S., and Wiker, C., IEEE Trans. on Appl. Supercond., 7, 1283(1997).Google Scholar
3. Paven-Thivet, C.Le., Guilloux-Viry, M., Padiou, J., Perrin, A., Sergent, M., Vaulchier, L.A. de, and Bontemps, N., Physica C 244, 231(1995).Google Scholar
4. Laderman, S.S., Taber, R.C., Jacowits, R.D., Moll, J.L., Eom, C.B., Hylton, T.L., Marshall, A.F., Geballe, T.H., and Beasley, M.R., Phys.Rev. B43, 2922(1991).Google Scholar
5. Hylton, T.L., Kapitulnik, A., and Beasley, M.R., Appl.Phys.Let., 53, 1343(1988).Google Scholar
6. Attanasio, C., Maritato, L., and Vaglio, R., Phys.Rev. B 43, 6129(1991).Google Scholar
7. Srivastava, G.P., Mohan Jacob, V., Jayakumar, M., and Bhatnagar, P.K., J.Appl.Phys., 81, 6272(1997).Google Scholar
8. Akasegawa, A., Yamanaka, K., and Nakanishi, T., M2S-HTSC-VI ; Proceeding to be published.Google Scholar
9. Okai, D., Tachiki, T., Shinkai, Y., and Ohshima, S., ISS’97, 1161(1997).Google Scholar
10. Oates, D.E., and Anderson, A.C., IEEE Trans on Mag., 27, 867(1991).Google Scholar
11. Oates, D.E., Anderson, A.C., Sheen, D.M., and Ali, S.M., IEEE Trans on MTT, 39,1522(1991).Google Scholar
12. Oates, D.E., Anderson, A.C., and Mankiewich, P.M., J.Supercond., 3, 251(1990).Google Scholar
13. Miura, S., Hashimoto, K., WEN, Jian-Guo, Suzuki, K., and Morishita, T., IEICE Trans. Electron E81-C, 1553(1998).Google Scholar