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The Effect Of Trace Element Segregation To Fe/Sapphire Interfaces

Published online by Cambridge University Press:  25 February 2011

D. P. Pope  and
M. A. Smith
D. P. Pope
Affiliation:
Department of Material Science, University of Pennsylvania, 3231 Walnut St., Philadelphia, PA 19104
M. A. Smith
Affiliation:
Department of Material Science, University of Pennsylvania, 3231 Walnut St., Philadelphia, PA 19104
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Abstract

The effects of segregation of tramp impurities such as sulfur on metal/ceramic bonding is discussed. Microstructural and chemical information is given for the Fe/sapphire interface. The segregation behavior of the interface is evaluated between 500–800 °C. The interfacial structure is shown to be important to the segregation behavior. A possible link between the segregation of sulfur and interface void formation is presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 238: Symposium Cb – Structure and Properties of Interfaces in Materials , 1991 , 427
Copyright
Copyright © Materials Research Society 1992

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References

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