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Early Stages Of Reaction Between Amorphous Ni-Nb And Crystalline Au Films

Published online by Cambridge University Press:  26 February 2011

E. A. Dobisz ,
H. G. Craighead ,
J. H. Perepezko ,
J. D. Wiley ,
B. L. Doyle  and
P. S. Peercy
E. A. Dobisz
Affiliation:
Bell Communications Research, Holmdel, NJ 07733
H. G. Craighead
Affiliation:
Bell Communications Research, Holmdel, NJ 07733
J. H. Perepezko
Affiliation:
University of Wisconsin, Madison, WI 53706
J. D. Wiley
Affiliation:
University of Wisconsin, Madison, WI 53706
B. L. Doyle
Affiliation:
Sandia National Laboratories, Alburquerque, NM 87185
P. S. Peercy
Affiliation:
Sandia National Laboratories, Alburquerque, NM 87185
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Abstract

Thin film interactions between a-(Ni-Nb) and polycrystalline Au over-layers have been studied with high depth resolution (≤1.7nm) Rutherford backscattering (RBS) and TEM to obtain information on the early stages of reaction at the interface. The RBS spectra from Au indicated that the interdiffused samples consisted of two layers: an Au-Nb binary layer on the surface and a ternary Au-Ni-Nb compound layer beneath the binary layer. The growth kinetics of the ternary compound layer differed in samples which had been relaxed prior to Au deposition from the kinetics for unrelaxed samples. Furthermore, cross section TEM micrographs showed that relaxed and unrelaxed samples exhibit different microstructures after the early stages, of annealing. We interpret this result to indicate that the reaction stages in relaxed samples are not as advanced as those in the unrelaxed samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 54 , 1985 , 147
Copyright
Copyright © Materials Research Society 1986

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Footnotes

*

Work performed at Sandia National Laboratories was supported by the U. S. Department of Energy under Contract DE-AC04-76DP00789 and work at the University of Wisconsin under Contract DE-FG02-84ER45069.

References

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