Skip to main content Accessibility help
×
Home

Dynamic photo-induced force microscopy

  • Junghoon Jahng (a1) and Eric O. Potma (a2)

Abstract

We provide a general description of the operating principle of the photo-induced force microscope (PiFM), which probes the optically induced changes in the dipolar interactions between a sharp polarizable tip and the sample, in terms of classical fields and forces. We rigorously calculate the photo-induced force behavior and compare the predicted profile with experimental results obtained from a gold nanowire.

Copyright

References

Hide All
1. Jahng, J., Brocious, J., Fishman, D. A., Huang, F., Li, X., Tamma, V. A., Wickramasinghe, H. K., and Potma, E. O., Phys. Rev. B 90, 155417 (2014).
2. Rajapaksa, I., Uenal, K., and Wickramasinghe, H. K., Appl. Phys. Lett. 97, 073121 (2010).
3. Garcia, R. and Herruzo, E. T., Nat. Nanotechnol. 7, 217 (2012).
4. Lozano, J. R. and Garcia, R., Phys. Rev. B 79, 014110 (2009).
5. Lee, M. and Jhe, W., Phys. Rev. Lett. 97, 036104 (2006); J. E. Sader and S. P. Jarvis, Appl. Phys. Lett. 84, 1801(2004); J. E. Sader et al., Nanotechnology 16, S94 (2005); B. Anczykowski et al., Appl. Surf. Sci. 140, 376 (1999).

Keywords

Dynamic photo-induced force microscopy

  • Junghoon Jahng (a1) and Eric O. Potma (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed