Hostname: page-component-77c89778f8-gq7q9 Total loading time: 0 Render date: 2024-07-21T17:30:34.166Z Has data issue: false hasContentIssue false

Doping Study of Se into AlGaAs Layers Grown by MBE, and their Application to HEMT Structures

Published online by Cambridge University Press:  26 February 2011

T. Maed
Affiliation:
Fujitsu Limited, 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
T. Ishikawa
Affiliation:
Fujitsu Limited, 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
K. Kondo
Affiliation:
Fujitsu Limited, 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
Get access

Abstract

We studied doping Se into AlGaAs layers using PbSe as a dopant source for molecular beam epitaxy (MBE). Good controllability and abruptness equivalent to that of Si-doping were obtained. Se-doping was successfully applied to HEMT structures with reduced DX center concentrations. The two dimensional electron gas (2DEG) characteristics of these structures were comparable to those of Si-doped structures.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kastalsky, A. and Kiehl, R. A., IEEE Trans. Electron Devices ED–33. 414 (1986)Google Scholar
2. Ishikawa, T., Yamamoto, T., and Kondo, K., Jpn. J. Appl. Phys. 25, L484 (1986)Google Scholar
3. Ishikawa, T., Maeda, T., and Kondo, K., Appl. Phys Lett. 53, 1926 (1988)Google Scholar
4. Yamaguchi, E., Jpn. J. Appl. Phys. 25, L643 (1986)CrossRefGoogle Scholar
5. Wood, C. E. C., Appl. Phys. Lett. 33, 770 (1978)Google Scholar
6. Hirayama, C., J. Chem. Eng. Data 9, 65 (1964)Google Scholar
7. McAfee, S. R., Tsang, W. T., and Lang, D. V., J. Appl. Phys. 52, 6155 (1981)Google Scholar
8. Hiyamizu, S., Fujii, T., Mimura, T., Nanbu, K., Saito, J., and Hashimoto, H., Jpn. J. Appl. Phys. 20, L455 (1981)CrossRefGoogle Scholar
9. Goldstein, B., Phys. Rev. 121, 1305 (1961)Google Scholar
10. Schubert, E. F., Stark, J. B., Chiu, T. H., and Tell, B., Appl. Phys. Lett. 53, 295 (1988)Google Scholar
11. Cho, A. Y., J. Appl. Phys. 46, 1733 (1975)CrossRefGoogle Scholar
12. Saito, J., Nanbu, K., Ishikawa, T., and Hiyamizu, S., Jpn. J. Appl. Phys. 22, L79 (1983)CrossRefGoogle Scholar