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Disordering of a Short Period GaAs-AlGaAs Superlattice by C Diffusion

Published online by Cambridge University Press:  22 February 2011

Z. Jamal
Affiliation:
Department of Materials Science and Engineering, University of Liverpool, Liverpool, L69 3BX, United Kingdom
P. J. Goodhew
Affiliation:
Department of Materials Science and Engineering, University of Liverpool, Liverpool, L69 3BX, United Kingdom
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Abstract

Carbon doping of GaAs and AlGaAs is easily carried out during chemical beam epitaxy by controlling the proportions of the precursors trimethylgallium and triethylgallium. The diffusion of C introduced at levels of up to 1020 cm−3, has been studied by SIMS and by TEM. In the latter case the destruction of short period GaAs-Al.3Ga.7As superlattices was monitored in order to assess the extent of diffusion after annealing at 800°C. The results confirm that C is quite a stable dopant. In addition, the destruction of the superlattices indicates that the diffusion mechanism of C involves group III sublattice sites.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

[1] Chiu, T. H., Cunningham, J. E., Ditzenberger, J. A., Jan, W. Y. and Chu, S. N. G., J. Crystal Growth, 111, 274 (1991).Google Scholar
[2] Malik, R. J., Schubert, R. N., Walker, J. F. and Ryan, R. W., Appl. Phys. Lett., 53, 2661 (1988).Google Scholar
[3] Cunningham, B. T., Guido, L. J., Baker, J. E., Major, J. S. Jr, Holonyak, N. and Stillman, G. E., Appl. Phys. Lett., 55, 687 (1989).Google Scholar
[4] Konagai, M., Yamada, T., Akatsuka, T., Saito, K., Tokomitsu, E. and Takahashi, K., J. Crystal Growth, 98, 167 (1989).Google Scholar
[5] Abernathy, C. R., Pearton, S. J., Manasreh, M. O., Fischer, D. W. and Talwar, D. N., Appl. Phys. Lett., 57, 294(1990).Google Scholar
[6] Hanna, M. C., Majerfeld, A. and Szmyd, D. M., Appl. Phys. Lett., 59, 2001 (1991).Google Scholar
[7] Kawabe, M., Matsuura, N., Shimizu, N., Hasegawa, F. and Nannichi, Y., Jpn. J. Appl. Phys., 23, L623 (1984).Google Scholar
[8] Rao, E. V. K., Thibierge, H., Brillouet, F., Alexandre, F. and Azoulay, R., Appl. Phys. Lett., 46, 867 (1985).Google Scholar
[9] Clegg, J. B., in Growth and Characterisation of Semiconductors, edited by Stradling, R. A. & Klipstein, P. C. (Adam Hilger, Bristol, 1990) p. 87.Google Scholar