Skip to main content Accessibility help
×
Home

Dislocations in thin metal films observed with X-ray diffraction

  • Léon J. Seijbel (a1) and Rob Delhez (a2)

Abstract

X-ray diffraction has been used to measure the stress, the crystallite size and the dislocation distribution in thin metal layers. By measuring two orders of a reflection, the contribution of the size distribution to the diffraction line broadening can be eliminated. A model equation is fitted to the strain Fourier coefficients of the diffraction line from which the dislocation arrangement can be obtained. For untextured nickel on steel or on silicon the dislocation densities have been obtained. It is demonstrated that for highly textured layers more information can be obtained than for untextured layers. It was found that a heated molybdenum layer on oxidized silicon showed only inclined screw dislocations.

Copyright

References

Hide All
1. Wilkens, M., Phys. Stat. Sol. 2, 359, (1970)
2 Warren, B.E. in X-Ray Diffraction, (Addison-Wesley, Reading MA, 1969)
3 Delhez, R., Keijser, Th. H. de, and Mittemeijer, E.J., Fresenius Z. Anal. Chem. 312, 1, (1982)
4 Klimanek, P. and Kuzel, R., J. Appl. Cryst. 21, 59, (1988)
5 Berk, I.M. van den, Seijbel, L.J., and Delhez, R., submitted to: Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures, (MRS proceedings spring 2001)
6 Kamminga, J.-D. and Delhez, R., Mater. Sci & Engin. A 309–310, 55, (2001)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed