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Direct Observation by Transmission Electron Microscopy of the Early Stages of Growth of Superconducting Thin Films

Published online by Cambridge University Press:  28 February 2011

M. Grant Norton ,
Lisa A. Tietz ,
Scott R. Summerfelt  and
C. Barry Carter
M. Grant Norton
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Lisa A. Tietz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Scott R. Summerfelt
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
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Abstract

The fabrication of high quality thin films often depends on the early stages of the growth process during which epitaxy is established. The substrate surface structure generally plays a critical role at this stage. Many observations of the high‐Tc superconductor film‐substrate interface structure and chemistry have been made by transmission electron microscopy (TEM) of cross‐section samples. Ion‐milling induced damage, however, can be severe in these specimens. In the present study, the early stages of the growth of high Tc superconducting thin films of YBa2Cu3O7δ have been studied by TEM using a technique which requires no post‐deposition specimen preparation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 509
Copyright
Copyright © Materials Research Society 1990

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References

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