Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-19T12:18:33.992Z Has data issue: false hasContentIssue false

Diffusion of Point Defects in a Stressed Simple Cubic Lattice

Published online by Cambridge University Press:  25 February 2011

Dimitrios Maroudas
Affiliation:
Massachusetts Institute of Technology, Department of Chemical Engineering, Cambridge, MA 02139
Robert A. Brown
Affiliation:
Massachusetts Institute of Technology, Department of Chemical Engineering, Cambridge, MA 02139
Get access

Abstract

A systematic theoretical and computational study is presented for the diffusion of point defects in a stressed cubic lattice. The study combines an atomistic description of point defect migration with a continuum model for point defect transport. Moment analysis of the macroscale transport equation gives expressions for the drift velocity and the diffusivity tensor of the point defects, which are calculated by a dynamic Monte Carlo simulation of the defect migration process. Results are presented for the case of diffusion under a constant force of interaction between the applied stress on the crystal and the defects. The continuum model gives the general constitutive model for stress-assisted point defect diffusion.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Maroudas, D., and Brown, R. A., in preparation (1989)Google Scholar
2 Jacoboni, C., and Reggiani, L., Rev. Mod. Phys., 55, 545 (1983)Google Scholar
3 Kang, H. C., and Weinberg, W. H., J. Chem. Phys., 90, 2824 (1989)Google Scholar
4 Limoge, Y., and Bocquet, L., Acta Metallurgica, 36, 1717 (1988)Google Scholar
5 Kirchheim, R., and Stolz, U., Acta Metallurgica, 35, 281 (1987)Google Scholar
6 Lancon, F., Billard, L., Chambron, W., and Chamberod, A., J. Phys. F : Met. Phys., 15, 1485 (1985)Google Scholar