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Dielectric Tensor Characterization for Overcoated Amorphous TbFe Alloys

Published online by Cambridge University Press:  26 February 2011

M. Ruane ,
A. Jain ,
R. Rosenvold  and
M. Mansuripur
M. Ruane
Affiliation:
Boston University, College of Engineering, 110 Cummington Street, Boston, MA 02215 USA
A. Jain
Affiliation:
Boston University, College of Engineering, 110 Cummington Street, Boston, MA 02215 USA
R. Rosenvold
Affiliation:
Boston University, College of Engineering, 110 Cummington Street, Boston, MA 02215 USA
M. Mansuripur
Affiliation:
Boston University, College of Engineering, 110 Cummington Street, Boston, MA 02215 USA
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Abstract

Amorphous thin films of TbFe. sputter-deposited on quartz substrates with compositions supporting polar Kerr magneto-optical behavior, and overcoated with a transparent protective layer, are studied to determine their dielectric tensor elements. Refleetivity measurements over a range of angles of incidence are made in an apparatus that corrects for the overcoat layer and exploits magnetization reversal to enhance the measurement of r⊥, the complex reflectivity associated with the magneto-optical signal. Conventional Fresnel reflectivities are also found. The theoretical model for reflectivities from a thick film magneto-optical medium at oblique incidenci is developed and used within a Levenberg-Marquardt nonlinear estimation algorithm to estimate sequentially the dielectric tensor elements, considering their widely varying magnitudes and sensitivities to errors in reflectivity data. The interpretation of the dielectric elements in terms of magneto-optical performance and structural perpendicular anisotropy is discussed.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 80: Symposium G – Science and Technology of Rapidly Quenched Alloys , 1986 , 401
Copyright
Copyright © Materials Research Society 1987

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References

[1] Chaudhari, P., Cuomo, J.J., and Gambino, R.J., Appl. Phys. Lett. 22, 337 (1973)CrossRefGoogle Scholar
[2] Mimura, Y., Imamura, N., and Kobayashi, T., IEEE Trans. Magn. 12, 779 (1976)CrossRefGoogle Scholar
[3] Togami, Y., IEEE Trans. Magn. 18, 1233 (1982)CrossRefGoogle Scholar
[4] Suits, J.C., Geiss, R.H., Lin, C.J., Rugar, D., and Bell, A.E., Appl. Phys. Lett. 49, 419 (1986)CrossRefGoogle Scholar
[5] Connell, G.A.N., Allen, R.. and Mansuripur, M.. J. Appl. Phys. 53, 7759 (1982)CrossRefGoogle Scholar
[6] Wolniansky, P., Chase, S., Rosenvold, R., Ruane, M., Mansuripur, M., J. Appl. Phys. 60 (1), 346 (1986)CrossRefGoogle Scholar
[7] Mansuripur, M.. Appl. Phys. Lett., 49, 19 (1986)CrossRefGoogle Scholar
[8] Sprokel, G.J., Appl. Opt.. 23. 3983 (1984)CrossRefGoogle Scholar
[9] Sprokel, G.J., Appl. Opt.. bf 25, 4017 (1986)CrossRefGoogle Scholar
[10] Corke, M.. Dawkins, A.W.J.. and Inwood, R.B., J.Phys.E: Sci. Instrum. 15, 251 (1982)CrossRefGoogle Scholar
[11] Ruane, M., Mansuripur, M. and Rosenvold, R., Appl. Optics 25, 1946 (1986)CrossRefGoogle Scholar
[12] Brown, K.M. and Dennis, J.E., Numerische Mathemathk 18, 289 (1972)CrossRefGoogle Scholar
[13] International Mathematical Subroutine Library, Ed. 9, IMSL, Inc., Houston, Texas (1982)Google Scholar
[14] Connell, G.A.N. and Bloomberg, D.S., in Mott Festschrift, (Plenum, New York) (1985)Google Scholar