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Dielectric Characterization of Polyceram Films

Published online by Cambridge University Press:  28 February 2011

G. Teowee ,
J.M. Boulton ,
H.H. Fox ,
A. Koussa ,
T. Gudgel  and
D.R. Uhlmann
G. Teowee
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
J.M. Boulton
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
H.H. Fox
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
A. Koussa
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
T. Gudgel
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
D.R. Uhlmann
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
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Abstract

Polycerams are an emergent class of hybrid, multifunctional materials which combine the properties of organic and inorganic materials. Films have been prepared from silicon alkoxides and reactive, functionalized polymers such as triethoxysilyl modified polybutadiene (MPBD), (N-triethoxysilylpropyl)O polyethylene oxide urethane (MPEOU) and trimethoxysilylpropyl substituted polyethyleneimine (MPEI). Characterization of dielectric constant and tan δ of the films has been carried out over a range of frequency from 500 Hz to 100 kHz; and the results are used to consider the potential of Polycerams as dielectric materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 180: Symposium A – Better Ceramics Through Chemistry IV , 1990 , 407
Copyright
Copyright © Materials Research Society 1990

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References

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