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Developments of SiC DioMOS (Diode Integrated SiC MOSFET)

Published online by Cambridge University Press:  03 June 2014

Makoto Kitabatake*
Affiliation:
Device Solution Center, R&D Division, Panasonic Corporation Yagumo-naka-machi 3-1-1, Moriguchi City, Osaka 570-8501 , Japan
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Abstract

SiC power devices can handle large power and high frequency switching beyond the Si power devices. Typical full-SiC power modules are composed of both SiC-MOSFETs and SiC-SBDs to suppress the degradation of Ron of SiC-MOSFET during the bipolar reverse-current flow while there will be unfavorable consequences such as increased material cost, larger area, and larger wiring inductances. Panasonic has proposed the SiC-DioMOS which successfully integrates the unipolar reverse diode without any increase of chip size from the original DIMOS transistor. The SiC-DioMOS utilizes the highly-doped n-type epitaxial channel under the MOS gate for the FET channel and also for the reverse conduction path of the diode. Thickness and concentration of the highly-doped n-typed channel are carefully designed to achieve reasonable Vth of the MOSFET and Vf0 barrier constituting the diode current. The MOSFET and also the MOS-channel diode completely operate under unipolar mode. The SiC-DioMOS with BVds=1700V, Ron=20mΩ、Vth=4.5V, Vf0=0.8V is successively fabricated using the state-of-the-art epitaxial-growth technique. Fast switching of tr=58ns and tf=13ns is confirmed. The SiC-DioMOS meets practical standards for safety operation of high-power fast switching without SiC-SBD.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

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References

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