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Depth Profile of the Excitonic Luminescence in Gallium-Nitride Layers

  • H. Siegle (a1), A. Hoffmann (a1), L. Eckey (a1), C. Thomsen (a1), T. Detchprohm (a2), K. Hiramatsu (a2), T. Davis (a3) and J. W. Steeds (a3)...

Abstract

We present results of spatially-resolved photoluminescence and Raman measurements on a 200 μm thick GaN layer grown on sapphire by hydride vapor phase epitaxy. Our microphotoluminescence measurements reveal that the peak position of the excitonic and donoracceptor-pair transitions strongly depends on the distance to the substrate interface. We observed a strong blue shift near the interface and discuss the influence of strain, which we quantified by micro-Raman experiments.

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1. For a review see for example: Strite, S., Lin, M. E., and Morkoç, H., Thin Solid Films 231, 197 (1993)
2. Siegle, H., Thurian, P., Eckey, L., Hoffmann, A., Thomsen, C., Meyer, B. K., Amano, H., Akasaki, I., Detchprohm, T., Hiramatsu, K., Appl. Phys. Lett. 68, 1265 (1996)
3. Ponce, F. A., Bour, D. P., Götz, W., Wright, P. J., Appl. Phys. Lett. 68, 57 (1996)
4. For a survey of Raman scattering in GaN see for example:Siegle, H., Eckey, L., Hoffmann, A., Thomsen, C., Meyer, B. K., Schikora, D., Hankeln, M., Lischka, K., Solid State Commun. 96, 943 (1995)
5. Hoffmann, A., in: Festkörperprobleme, ed. by Helbig, R., Advances in Solid State Physics 35, (Vieweg, Braunschweig/Wiesbaden 1996), in print
6. Hiramatsu, K., Detchprohm, T., Akasaki, I., Jpn. J. Appl. Phys. 32, 1528 (1993)
7. Kozawa, T., Kachi, T., Kano, H., Nagase, H., Koide, N., Manabe, K., J. Appl. Phys. 77, 4389 (1995)
8. Rieger, W., Metzger, T., Angerer, H., Dimitrov, R., Ambacher, O., Stutzmann, M., Appl. Phys. Lett. 68, 970 (1996)

Depth Profile of the Excitonic Luminescence in Gallium-Nitride Layers

  • H. Siegle (a1), A. Hoffmann (a1), L. Eckey (a1), C. Thomsen (a1), T. Detchprohm (a2), K. Hiramatsu (a2), T. Davis (a3) and J. W. Steeds (a3)...

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