PECVD processes are the most common way of growing amorphous and microcrystalline silicon thin films. These low pressure plasmas are known to generate large amounts of particles in the gas phase which may be a source of contamination in the production of silicon based devices. In this report, however, we show that these particles can be incorporated profitably into a growing film, provided that their size is controlled. The Modulation of the RF power is a direct method of controlling particle size. Plasma characteristics determine the dynamics of particle formation, whereas the duration of the plasma-on period controls the particle's size and atomic structure. The size and atomic structure of particles from two different periods of the same discharge were investigated. Their main characteristics, monodisperse size distribution and ordered atomic structure, are discussed in the context of the latest findings on particle nucleation and coagulation.

A semi-phenomenological model was used to show that, during the first milliseconds of the discharge, particles of 1–2 nm that are electrically neutral may leave the plasma and contribute to the growth of the film. Although these particles could not be observed on the TEM grid, their contribution to film growth might be relevant.