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Density Changes in Amorphous Pd80Si20 During Low Temperature ion Irradiation

Published online by Cambridge University Press:  16 February 2011

G. Schumacher ,
R.C. Birtcher  and
L.E. Rehn
G. Schumacher
Affiliation:
Argonne National Laboratory, Materials Science Division, 9700 South Cass Avenue, Argonne, IL 60439
R.C. Birtcher
Affiliation:
Argonne National Laboratory, Materials Science Division, 9700 South Cass Avenue, Argonne, IL 60439
L.E. Rehn
Affiliation:
Argonne National Laboratory, Materials Science Division, 9700 South Cass Avenue, Argonne, IL 60439
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Abstract

Density changes in amorphous Pd80Si20 during ion irradiation below 100K were detected by in situ HVEM measurements of the changes in specimen length as a function of ion fluence. A decrease in mass density as a function of the ion fluence was observed. The saturation value of the change in mass density was determined to be approximately -1.2 %.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 373: Symposium Y – Microstructure of Irradiated Materials , 1994 , 261
Copyright
Copyright © Materials Research Society 1995

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References

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