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Defect Engineered Multi-Walled Carbon Nanotube arrays as Electrochemical Double Layer Capacitors

  • Rajaram Narayanan (a1), Mark Hoefer (a2) and Prabhakar R. Bandaru (a1) (a2)

Abstract

The efficacy of vertically aligned defect engineered multi-walled carbon nanotube (MWCNT) arrays as electrochemical double layer capacitors (EDLCs) was investigated using standard electrochemical techniques such as cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). We report a ∼ 200% improvement in specific double layer capacitance of MWCNT arrays by extrinsically introducing defects using argon plasma irradiation. The capacitance-voltage characteristics of argon irradiated MWCNTs provide insights into the nature of the defects and their influence on the specific capacitance (capacitance/area).

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Keywords

Defect Engineered Multi-Walled Carbon Nanotube arrays as Electrochemical Double Layer Capacitors

  • Rajaram Narayanan (a1), Mark Hoefer (a2) and Prabhakar R. Bandaru (a1) (a2)

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