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Damage Accumulation in MgAl2O4 Crystals by Xe Ion Irradiations

  • N. Yu (a1), M. Nastasi (a1), M.G. Hollander (a1), C.R. Evans (a1), C.J. Maggiore (a1), K.E. Sickafus (a1) and J.R. Tesmer (a1)...

Abstract

We have studied the damage kinetics in single crystal MgAl2O4 (spinel) with (100) orientation under 370 keV Xe ion irradiations at temperatures of -100 and 400 C. In-situ Rutherford Backscattering Spectrometry (RBS) and ion channeling have been used to monitor the damage accumulation in spinel following sequential Xe ion irradiations. A significant temperature effect on the irradiation damage has been found. Channeling data show that at -100 C, the irradiated spinel layer reaches the same level as in a random spectrum at a dose of 8×1015 Xe/cm2 (20 DPA for peak damage), while at 400 C, the near surface region (50 nm) remains single-crystalline up to 2×1016 Xe/cm2.

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Damage Accumulation in MgAl2O4 Crystals by Xe Ion Irradiations

  • N. Yu (a1), M. Nastasi (a1), M.G. Hollander (a1), C.R. Evans (a1), C.J. Maggiore (a1), K.E. Sickafus (a1) and J.R. Tesmer (a1)...

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