Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-26T22:38:02.707Z Has data issue: false hasContentIssue false
  • English
  • Français

Current Flow and Structural Inhomogeneities in Nonlinear Materials

Published online by Cambridge University Press:  10 February 2011

F. Greuter ,
T. Christen  and
J. Glatz-Reichenbach
F. Greuter
Affiliation:
ABB Corporate Research Ltd, CH-5405 Baden-Dättwil, Switzerland
T. Christen
Affiliation:
ABB Corporate Research Ltd, CH-5405 Baden-Dättwil, Switzerland
J. Glatz-Reichenbach
Affiliation:
ABB Corporate Research Ltd, CH-5405 Baden-Dättwil, Switzerland
Get access

Abstract

Nonlinear current flow in real 3-d composite materials is far more complex than suggested by usual brickstone models. We present experimental results on controlled seeding of structural inhomogeneities in varistor ceramics. In particular, we discuss the influence of mesoscopic imperfections on the characteristic electrical parameters. A main effect is a change in the statistical distribution of the grain size. As a consequence, the breakdown voltage drops very sensitively due to the disorder, while the shape of the I-V curve is hardly affected. We discuss also the extremely nonuniform filamentary current pattern, being illustrated by electroluminescence studies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 235
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Eda, K., J. Appl. Phys. 56 (10) p 2948 (1984).Google Scholar
2. Bartkowiak, M., Comber, M.G., Mahan, G.D., J. Appl. Phys. 79 (11) p 8629 (1996) and IEEE Trans. Power Delivery 97 (in press).Google Scholar
3. Vojta, A., Carke, D.R., J. Appl. Phys. 81 (2) p 985 (1997), Computational Mater. Sci. 6 p 51 (1996).Google Scholar
4. Strampler, R., Skindhøj, J., Glatz-Reichenbach, J., IEEE Trans PD (1997) in print;Google Scholar
Strümpler, R., Maidorn, G., Rhyner, J., J. Appl. Phys. 81 (10), p 6786 (1997);Google Scholar
Strampler, R., Glatz-Reichenbach, J., Greuter, F., MRS Symp. Proc. 411, p 393 (1996).Google Scholar
5. Strümpler, R., Kluge-Weiss, P., Greuter, F., Advances in Sci. and Techn. 10, p 15 (1995).Google Scholar
6. Clarke, D.R., J. Appl. Phys. 49 p 2407 (1978).Google Scholar
7. Olsson, E., Falk, L.K.L., Dunlop, G.L., Österlund, R., J. Mater. Sci. 20, 4091 (1985) and J. Appl. Phys. 66 p 4317 (1989) andGoogle Scholar
Olsson, E. PhD Thesis U. of Göteborg (1988).Google Scholar
8. Wang, H., Chiang, Y.M., J. Amer. Ceram. Soc. (1997) in press;Google Scholar
Wang, H. PhD Thesis MIT (1996).Google Scholar
9. Nied, H.F., Ceram. Trans. 3, p 274 (1988).Google Scholar
10. Levinson, L.M. and Philipp, H.R., Am. Ceram. Soc. Bull. 65 p 639 (1986).Google Scholar
11. Gupta, T.K., J. Am. Ceram. Soc, 73 p 1817 (1990).Google Scholar
12. Mahan, G.D., Levonson, L.M., Philipp, H.R., J. Appl. Phys. 50 p 2799 (1979).Google Scholar
13. Greuter, F., Blatter, G., Semicon. Sci. and Techn. 5 (2) p 111 (1990).Google Scholar
14. Bartkowiak, M., Mahan, G.D., Phys. Rev. B 51 p 10825 (1995).Google Scholar
Bartkowiak, M., Mahan, G.D., Modine, F.A., Alim, M.A., J. Appl. Phys. 79 (1) p 273 (1996),Google Scholar
Bartkowiak, M., Mahan, G.D., Modine, F.A., Alim, M.A., J. Appl. Phys. 80 (11), p 6516 (1996), Jpn. J. Appl. Phys. 35 L414 (1996), Proc. 8th EPS-APS Intern. Conf. Physics Computing PC96, Krakow, p 289 (1996), and this proceeding.Google Scholar
15. Osman, M., Perkins, R.S., Schmückle, F., Europ. Patent 0 200–126 (1985).Google Scholar
16. Inada, M., Jpn. J. Appl. Phys 17, p 1, (1978).Google Scholar
17. Emtage, P. R., J. Appl. Phys. 50, p 6833 (1979).Google Scholar
18. Pike, G.E., Kurtz, S.R., Gourley, P.L., Philipp, H.R., Levison, L.M., J. Appl. Phys. 57, p 5512 (1985).Google Scholar
19. Greuter, F., Rossinelli, M., Blatter, G., patent applic. 3921/85–0 (1985); Br. Ceram. Proc. 36, p 1 (1985);Google Scholar
Greuter, F., Rossinelli, M., Blatter, G., patent applic. 41, p 177 (1989).Google Scholar
20. Greuter, F., Blatter, G., Rossinelli, M., Schmückle, F., Mat. Sci. Forum 10–12, p 235 (1986).Google Scholar
21. Levinson, L.M., Philipp, H.R., J. Appl. Phys. 47, p 3116 (1976).Google Scholar