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Crystalline Texture of CoCrPt Films on CrMn/NiAl and Cr/NiAl Underlayer Structures

Published online by Cambridge University Press:  10 February 2011

J. Zou
Affiliation:
Department of Electrical and Computer Engineering
B. Lu
Affiliation:
Department of Electrical and Computer Engineering
A. E. Bayer
Affiliation:
Department of Materials Science and Engineering, Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou@ece.cmu.edu
D. E. Laughlin
Affiliation:
Department of Materials Science and Engineering, Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou@ece.cmu.edu
D. N. Lambeth
Affiliation:
Department of Electrical and Computer Engineering
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Abstract

In this study, we examine the effects of CrMn/NiAl and Cr/NiA1 underlayer structures on the crystalline texture and microstructure of CoCrPt magnetic films using x-ray and electron diffraction. The former underlayer structure was found to induce better CoCrPt (image1) texture. The stress in the CoCrPt layer was measured. The effective in-plane anisotropy energy densities of the CoCrPt films on the above two underlayers were also measured by using out-of-plane torque and Miyajima methods and the result was consistent with the texture analysis.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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