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Cross-Sectional TEM Studies of DIGM in Irradiated Au-Cu Bilayers

Published online by Cambridge University Press:  25 February 2011

Yuzun Gao ,
Dale E. Alexander  and
L. E. Rehn
Yuzun Gao
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Dale E. Alexander
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
L. E. Rehn
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
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Abstract

Cross-sectional transmission electron microscopy was used to study diffusion-induced grain boundary migration (DIGM) in irradiated and annealed Au/Cu bilayers. Using this technique, in combination with small probe X-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 279: Symposium A – Beam-Solid Interactions–Fundamentals and Applications , 1992 , 369
Copyright
Copyright © Materials Research Society 1993

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References

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